About: Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies     Goto   Sponge   NotDistinct   Permalink

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  • Microcrystalline silicon is very important material for silicon based thin-film solar cells. X-ray diffraction, Raman and FTIR spectroscopies are powerful experimental methods, which can answer the questions dealing with the crystal structure and hydrogen distribution in the material analyzed. On the other hand, optical band-gaps, spectral refractive indices and absorption properties of the films can be carried out from the UV-Vis spectroscopy.
  • Microcrystalline silicon is very important material for silicon based thin-film solar cells. X-ray diffraction, Raman and FTIR spectroscopies are powerful experimental methods, which can answer the questions dealing with the crystal structure and hydrogen distribution in the material analyzed. On the other hand, optical band-gaps, spectral refractive indices and absorption properties of the films can be carried out from the UV-Vis spectroscopy. (en)
Title
  • Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies
  • Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies (en)
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  • Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies
  • Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies (en)
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  • RIV/49777513:23640/12:43916613!RIV13-MSM-23640___
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  • P(ED2.1.00/03.0088)
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  • 150429
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  • RIV/49777513:23640/12:43916613
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  • breadths; Raman spectroscopy; XRD, FTIR; microcrystalline silicon (en)
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  • [12DBC9A5A5EA]
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  • Florence, Italie
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  • Bratislava
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  • Progress in Applied Surface, Inteface and Thin Film Science 2012, SURFINT -SREN III
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  • Netrvalová, Marie
  • Šutta, Pavol
  • Prušáková, Lucie
  • Calta, Pavel
  • Müllerová, Jarmila
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number of pages
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  • Univerzita Komenského v Bratislave
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  • 978-80-223-3212-5
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  • 23640
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