About: Process stabilization and a significant enhancement of the deposition rate in reactive high-power impulse magnetron sputtering of ZrO2 and Ta2O5 films     Goto   Sponge   NotDistinct   Permalink

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Description
  • High-power impulse magnetron sputtering with a pulsed reactive gas (oxygen) flow control was used for high-rate reactive depositions of densified stoichiometric ZrO2 and Ta2O5 films onto floating substrates. The depositions were performed using a strongly unbalanced magnetron with a planar zirconium or tantalum target of 100 mm diameter in argon-oxygen gas mixtures at the total pressure close to 2 Pa. The repetition frequency was 500 Hz at the average target power density from 5 W/cm^2 to 103 W/cm^2 during a deposition. The duty cycles ranged from 2.5 % to 10 %. The target-to-substrate distance was 100 mm. For the same duty cycle of 10 %, the deposition rates were up to 140 nm/min for the ZrO2 films and up to 345 nm/min for the Ta2O5 films. The ZrO2 films were crystalline. They exhibited a refractive index of 2.19 - 2.22 and an extinction coefficient of 0.002 - 0.006. The Ta2O5 films were nanocrystalline. They exhibited a refractive index of 2.09 - 2.15 and an extinction coefficient of less than 0.0001.
  • High-power impulse magnetron sputtering with a pulsed reactive gas (oxygen) flow control was used for high-rate reactive depositions of densified stoichiometric ZrO2 and Ta2O5 films onto floating substrates. The depositions were performed using a strongly unbalanced magnetron with a planar zirconium or tantalum target of 100 mm diameter in argon-oxygen gas mixtures at the total pressure close to 2 Pa. The repetition frequency was 500 Hz at the average target power density from 5 W/cm^2 to 103 W/cm^2 during a deposition. The duty cycles ranged from 2.5 % to 10 %. The target-to-substrate distance was 100 mm. For the same duty cycle of 10 %, the deposition rates were up to 140 nm/min for the ZrO2 films and up to 345 nm/min for the Ta2O5 films. The ZrO2 films were crystalline. They exhibited a refractive index of 2.19 - 2.22 and an extinction coefficient of 0.002 - 0.006. The Ta2O5 films were nanocrystalline. They exhibited a refractive index of 2.09 - 2.15 and an extinction coefficient of less than 0.0001. (en)
Title
  • Process stabilization and a significant enhancement of the deposition rate in reactive high-power impulse magnetron sputtering of ZrO2 and Ta2O5 films
  • Process stabilization and a significant enhancement of the deposition rate in reactive high-power impulse magnetron sputtering of ZrO2 and Ta2O5 films (en)
skos:prefLabel
  • Process stabilization and a significant enhancement of the deposition rate in reactive high-power impulse magnetron sputtering of ZrO2 and Ta2O5 films
  • Process stabilization and a significant enhancement of the deposition rate in reactive high-power impulse magnetron sputtering of ZrO2 and Ta2O5 films (en)
skos:notation
  • RIV/49777513:23520/13:43920009!RIV14-GA0-23520___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GAP108/12/0393)
http://linked.open...iv/cisloPeriodika
  • 236
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 99949
http://linked.open...ai/riv/idVysledku
  • RIV/49777513:23520/13:43920009
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • High optical transparency; Densified films; Ta2O5; ZrO2; High deposition rates; Reactive HiPIMS (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [87B63F717515]
http://linked.open...i/riv/nazevZdroje
  • Surface & Coatings Technology
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 2013
http://linked.open...iv/tvurceVysledku
  • Houška, Jiří
  • Vlček, Jaroslav
  • Rezek, Jiří
  • Čerstvý, Radomír
  • Bugyi, Rafal
http://linked.open...ain/vavai/riv/wos
  • 000329884300074
issn
  • 0257-8972
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.surfcoat.2013.10.052
http://localhost/t...ganizacniJednotka
  • 23520
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