About: Spectral reflectrometry and white-light interferometry used to measure thin films     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • Two different spectral-domain techniques based on reflectometry and white-light interferometry are used to measure spectral characteristics of thin-film systems. A technique of spectral reflectometry uses a standard configuration with a halogen lamp, a reflection probe and a thin-film system under test to record the reflection spectrum over a wide range of wavelengths. A new white-light spectral interferometric technique uses a slightly dispersive Michelson interferometer with a cube beamsplitter to measure the phase spectra of reflective or transparent thin-film systems over a wide range of wavelengths. This technique is based on a Fourier transform method in processing the recorded spectral interferograms to obtain the ambiguous spectral fringe phase function...
  • Two different spectral-domain techniques based on reflectometry and white-light interferometry are used to measure spectral characteristics of thin-film systems. A technique of spectral reflectometry uses a standard configuration with a halogen lamp, a reflection probe and a thin-film system under test to record the reflection spectrum over a wide range of wavelengths. A new white-light spectral interferometric technique uses a slightly dispersive Michelson interferometer with a cube beamsplitter to measure the phase spectra of reflective or transparent thin-film systems over a wide range of wavelengths. This technique is based on a Fourier transform method in processing the recorded spectral interferograms to obtain the ambiguous spectral fringe phase function... (en)
  • Dvě různé techniky ve spektrální doméně založené na reflektometrii a interferometrii v bílém světle jsou použity pro měření spektrálních charakteristik systémů s tenkými filmy. Technika spektrální reflektometrie používá standardní konfiguraci s halogenovou lampou, reflexní sondou a systémem testovaných tenkých filmů k záznamu reflexního spektra přes široký rozsah vlnových délek. Nová technika spektrální interferometrie v bílém světle používá lehce disperzivní Michelsonův interferometr a krychlovým děličem paprsku k měření fázového spektra reflexního nebo transparentního systému tenkých filmů přes široký rozsah vlnových délek. (cs)
Title
  • Využití spektrální reflektometrie a interferometrie v bílém světle pro měření tenkých filmů (cs)
  • Spectral reflectrometry and white-light interferometry used to measure thin films
  • Spectral reflectrometry and white-light interferometry used to measure thin films (en)
skos:prefLabel
  • Využití spektrální reflektometrie a interferometrie v bílém světle pro měření tenkých filmů (cs)
  • Spectral reflectrometry and white-light interferometry used to measure thin films
  • Spectral reflectrometry and white-light interferometry used to measure thin films (en)
skos:notation
  • RIV/47813059:19240/04:#0002012!RIV09-MSM-19240___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • S
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 587385
http://linked.open...ai/riv/idVysledku
  • RIV/47813059:19240/04:#0002012
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • INTERFERENCE, THICKNESS (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [3F269E9B6600]
http://linked.open...v/mistoKonaniAkce
  • Strasbourg, FRANCE
http://linked.open...i/riv/mistoVydani
  • BELLINGHAM, USA
http://linked.open...i/riv/nazevZdroje
  • PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hlubina, Petr
http://linked.open...vavai/riv/typAkce
http://linked.open...ain/vavai/riv/wos
  • 000224432300083
http://linked.open.../riv/zahajeniAkce
issn
  • 0277-786X
number of pages
http://purl.org/ne...btex#hasPublisher
  • SPIE-INT SOC OPTICAL ENGINEERING
https://schema.org/isbn
  • 0-8194-5379-X
http://localhost/t...ganizacniJednotka
  • 19240
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 48 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software