About: Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer.

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About: Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer. Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The spectral interference of two beams from a white-light source, a tungsten halogen lamp, is measured at the output of a dispersive Michelson interferometer by a low-resolution miniature fiber optic spectrometer when the interferometer beam splitter is made of fused silica. It is confirmed that the spectral interference fringes are resolved only in the vicinity of the equalization wavelength whose value is dependent on the group optical path difference in the interferometer. Thus, the equalization wavelength is measured as a function of the displacement in the interferometer in the spectral range approximately from 490 to 870 nm. Moreover, when the group refractive index of fused silica is evaluated at the equalization wavelengths by using the Sellmeier dispersion equation, it is confirmed, in accordance with the theory, that the measured displacement as a function of the group refractive index of fused silica is a straight line whose slope gives the effective thickness of the beam splitter. The spectral interference of two beams from a white-light source, a tungsten halogen lamp, is measured at the output of a dispersive Michelson interferometer by a low-resolution miniature fiber optic spectrometer when the interferometer beam splitter is made of fused silica. It is confirmed that the spectral interference fringes are resolved only in the vicinity of the equalization wavelength whose value is dependent on the group optical path difference in the interferometer. Thus, the equalization wavelength is measured as a function of the displacement in the interferometer in the spectral range approximately from 490 to 870 nm. Moreover, when the group refractive index of fused silica is evaluated at the equalization wavelengths by using the Sellmeier dispersion equation, it is confirmed, in accordance with the theory, that the measured displacement as a function of the group refractive index of fused silica is a straight line whose slope gives the effective thickness of the beam splitter. (en)
Title	Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer. Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer. (en)
skos:prefLabel	Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer. Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer. (en)
skos:notation	RIV/47813059:19240/01:20000009!RIV/2002/GA0/192402/N
http://linked.open.../vavai/riv/strany	229;23
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA202/01/0077)
http://linked.open...vai/riv/dodaniDat	2002
http://linked.open...aciTvurceVysledku	Hlubina, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Slezská univerzita v Opavě / Filozoficko-přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	681395
http://linked.open...ai/riv/idVysledku	RIV/47813059:19240/01:20000009
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	White-light source; dispersive Michelson interferometer; low-resolution spectrometer; spectral interferogram; displacement; equalization wavelength; group refractive index dispersion; beam splitter; fuse (en)
http://linked.open.../riv/klicoveSlovo	fuse beam splitter equalization wavelength spectral interferogram displacement dispersive Michelson interferometer low-resolution spectrometer White-light source group refractive index dispersion
http://linked.open...ontrolniKodProRIV	[37A925FDB4C7]
http://linked.open...v/mistoKonaniAkce	Munich, Germany
http://linked.open...i/riv/mistoVydani	Munich
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Waveguiding and magneto-optical reflection effects in thin films and low-dimensional systems
http://linked.open...UplatneniVysledku	2001
http://linked.open...iv/tvurceVysledku	Hlubina, Petr
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2001-08-18 (xsd:date)
number of pages	9 (xsd:int)
http://purl.org/ne...btex#hasPublisher	SPIE-The International Society for Optical Engineering
https://schema.org/isbn	0-8194-4093-0
http://localhost/t...ganizacniJednotka	19240

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