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  • A phase field simulations of the polarisation reversal against the applied electric field in ferroelectric thin films, which is observed after poling of a ferroelectric film with a large electric field applied to a conductive tip of an atomic force microscope (AFM), is presented. Recent advances in the development of hard-disk-like data storage device that uses ferroelectric nano-domains in ferroelectric single crystals stimulate the interest of scientists in the study of domain dynamics. It is known that free charges, which can be injected from the AFM tip during the polarization reversal process into the ferroelectric film or on its surface, have a great effect on the stability of the reversed domains and can yield to several quite different scenarios during the domain reversal process. Since the role of free charges is not understood in great details yet, the aforementioned issues have motivated the study presented in this paper, where we will analyse the role of free charges during the polarization reversal process using phase field simulations.
  • A phase field simulations of the polarisation reversal against the applied electric field in ferroelectric thin films, which is observed after poling of a ferroelectric film with a large electric field applied to a conductive tip of an atomic force microscope (AFM), is presented. Recent advances in the development of hard-disk-like data storage device that uses ferroelectric nano-domains in ferroelectric single crystals stimulate the interest of scientists in the study of domain dynamics. It is known that free charges, which can be injected from the AFM tip during the polarization reversal process into the ferroelectric film or on its surface, have a great effect on the stability of the reversed domains and can yield to several quite different scenarios during the domain reversal process. Since the role of free charges is not understood in great details yet, the aforementioned issues have motivated the study presented in this paper, where we will analyse the role of free charges during the polarization reversal process using phase field simulations. (en)
Title
  • Domain back-switching due to the free charge injection under the AFM tip studied by phase field simulations
  • Domain back-switching due to the free charge injection under the AFM tip studied by phase field simulations (en)
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  • Domain back-switching due to the free charge injection under the AFM tip studied by phase field simulations
  • Domain back-switching due to the free charge injection under the AFM tip studied by phase field simulations (en)
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  • RIV/46747885:24220/11:#0001790!RIV12-GA0-24220___
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  • P(GAP204/10/0616)
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  • 195244
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  • RIV/46747885:24220/11:#0001790
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  • Ferroelectric semiconductors; Wide band-gap semiconductors; Spontaneous polarization; Atomic force microscopy; Reversed domain nucleation; Domain back-switching (en)
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  • [A84850481E0C]
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  • Vancouver BC, Canada
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  • PFM-ISAF-2011, Vancouver, Canada
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  • Simon Fraser University, Vancouver, Canada
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  • Mokrý, Pavel
  • Nováková, Kateřina
  • Sluka, Tomáš
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  • 24220
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