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Description
| - Advanced characterization techniques for ferroelectric thin films are important for successful application of ferroelectric materials in electronic devices. It is known that structural imperfections such as crystal lattice defects, grain boundaries or electrode-adjacent non-ferroelectric (dead) layers can badly deteriorate the dielectric response. We analyze the polarization reversal kinetics in systems with dead layers. We present the analysis of the experimental data within the conventional Kolmogorov-Avrami switching scenario and the exponential law for the field dependence of the domain wall velocity. In addition, we present a general characterization method for ferroelectric thin films, which is applicable to systems with the switching kinetics of a general type.
- Advanced characterization techniques for ferroelectric thin films are important for successful application of ferroelectric materials in electronic devices. It is known that structural imperfections such as crystal lattice defects, grain boundaries or electrode-adjacent non-ferroelectric (dead) layers can badly deteriorate the dielectric response. We analyze the polarization reversal kinetics in systems with dead layers. We present the analysis of the experimental data within the conventional Kolmogorov-Avrami switching scenario and the exponential law for the field dependence of the domain wall velocity. In addition, we present a general characterization method for ferroelectric thin films, which is applicable to systems with the switching kinetics of a general type. (en)
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Title
| - Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films
- Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films (en)
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skos:prefLabel
| - Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films
- Characterization of thin ferroelectric films using analysis of the polarization reversal kinetics: An application to P(VDF-TrFE) polymer films (en)
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skos:notation
| - RIV/46747885:24220/10:#0001734!RIV11-GA0-24220___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/46747885:24220/10:#0001734
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - Ferroelectric polymer; PVDF; Switching kinetics; Dielectric characterization; Ferroelectric domains (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...i/riv/kodPristupu
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/mistoVydani
| - Edinburgh, SCOTLAND, AUG 09-12, 2010
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http://linked.open...n/vavai/riv/nosic
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http://linked.open...telVyzkumneZpravy
| - Heriot-Watt University, Edinburgh, Scotland, UK EH14 4AS
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Mokrý, Pavel
- Tagantsev, Alexander K.
- Gysel, Roman
- Stolichnov, Igor
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http://localhost/t...ganizacniJednotka
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