About: Alternative Characterization Tool for Ferroelectric Polydomain Films

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Advanced characterization techniques for ferroelectric ceramics and films play an essential role in successful applications of ferroelectric materials in devices. It is known that the presence of crystal lattice defects or electrode-adjacent non-ferroelectric (dead) layers badly deteriorate the dielectric properties of ferroelectric thin films. We propose a characterization technique for ferroelectric polydomain films, which is based on the analysis of the higher-order harmonics in the small-signal dielectric response of the film. Such information can then be used as a feedback for modifying the thin film processing and for tailoring their dielectric properties. Numerical estimates relevant to PZT films are provided. Advanced characterization techniques for ferroelectric ceramics and films play an essential role in successful applications of ferroelectric materials in devices. It is known that the presence of crystal lattice defects or electrode-adjacent non-ferroelectric (dead) layers badly deteriorate the dielectric properties of ferroelectric thin films. We propose a characterization technique for ferroelectric polydomain films, which is based on the analysis of the higher-order harmonics in the small-signal dielectric response of the film. Such information can then be used as a feedback for modifying the thin film processing and for tailoring their dielectric properties. Numerical estimates relevant to PZT films are provided. (en)
Title	Alternative Characterization Tool for Ferroelectric Polydomain Films Alternative Characterization Tool for Ferroelectric Polydomain Films (en)
skos:prefLabel	Alternative Characterization Tool for Ferroelectric Polydomain Films Alternative Characterization Tool for Ferroelectric Polydomain Films (en)
skos:notation	RIV/46747885:24220/09:#0001261!RIV10-GA0-24220___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA101/08/1279), P(GA202/07/1289)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Mokrý, Pavel
http://linked.open.../riv/druhVysledku	A(V) - Audiovizuální tvorba se vzdáleným přístupem
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Technická univerzita v Liberci / Fakulta mechatroniky, informatiky a mezioborových studií
http://linked.open...dnocenehoVysledku	302545
http://linked.open...ai/riv/idVysledku	RIV/46747885:24220/09:#0001261
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Ferroelectric thin film; Dielectric aging; Dielectric characterization; Ferroelectric domains; Crystal lattice defects (en)
http://linked.open.../riv/klicoveSlovo	Crystal lattice defects Dielectric aging Ferroelectric thin film Dielectric characterization Ferroelectric domains
http://linked.open...i/riv/kodPristupu	L
http://linked.open...ontrolniKodProRIV	[DC54C6818AF8]
http://linked.open...i/riv/mistoVydani	Xian, People's Republic of China
http://linked.open...n/vavai/riv/nosic	IMF-ISAF-2009
http://linked.open...telVyzkumneZpravy	Electronic Materials Research Laboratory of Xi’an Jiaotong University, Xi'an 710049, People's Republic of China
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Electromechanical properties of aadvanced ferroelectrics materials Modern methods for noise and vibration suppression using piezoelectric materials
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Mokrý, Pavel Tagantsev, Alexander K.
http://linked.open...rzeVyzkumneZpravy	3
http://localhost/t...ganizacniJednotka	24220

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