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Description
  • Diagnostika systému na čipu je založena na navrženém standardu IEEE 1500 a dovoluje testováni jader v obvodech SoC kompresním testovacím vzorkem. RESPIN architektura testovací vzorek dekomprimuje a k dekomprimaci využívá jiných jader SoC obvodu. (cs)
  • SoC diagnostics is based on the proposed IEEE 1500 standard and allows testing of cores in the system-on-a-chip by compressed test patterns. The RESPIN architecture decompresses the test patterns of a core with using other idle cores in the SoC.
  • SoC diagnostics is based on the proposed IEEE 1500 standard and allows testing of cores in the system-on-a-chip by compressed test patterns. The RESPIN architecture decompresses the test patterns of a core with using other idle cores in the SoC. (en)
Title
  • System-on-a-Chip Diagnostics Using RESPIN Architecture
  • System-on-a-Chip Diagnostics Using RESPIN Architecture (en)
  • Diagnostika SoC obvodů využívající RESPIN architekturu (cs)
skos:prefLabel
  • System-on-a-Chip Diagnostics Using RESPIN Architecture
  • System-on-a-Chip Diagnostics Using RESPIN Architecture (en)
  • Diagnostika SoC obvodů využívající RESPIN architekturu (cs)
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  • RIV/46747885:24220/05:00000138!RIV06-GA0-24220___
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  • Design for Test; core test; RESPIN; System on a Chip; Test Access Mechanism (en)
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