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  • AFM, XRD, zeta (ζ) potential measurement and spectroscopic ellipsometry were used for characterization of thin (20 nm) Au films sputtered onto polyethyleneterephthalate (PET). Sputtered Au film shows significantly different surface morphology and roughness in comparison with pristine PET. From XRD measurement of 20 nm thick sputtered Au layers it was found that Au crystalizes preferentially in (111) direction with lattice parameter of a = 0.40769 nm, density of ρ = 19.338 g cm-3 and lattice strength of about 230 MPa. Higher surface conductance of Au/PET by ζ-potential measurement was found. Ordinary and extraordinary refractive index of uniaxial pristine PET was obtained in spectral range from 4 to 6 eV. Optical determination (ellipsometry) of Au layer thickness 19.4 nm was in good agreement with the estimated value of 20 nm (AFM).
  • AFM, XRD, zeta (ζ) potential measurement and spectroscopic ellipsometry were used for characterization of thin (20 nm) Au films sputtered onto polyethyleneterephthalate (PET). Sputtered Au film shows significantly different surface morphology and roughness in comparison with pristine PET. From XRD measurement of 20 nm thick sputtered Au layers it was found that Au crystalizes preferentially in (111) direction with lattice parameter of a = 0.40769 nm, density of ρ = 19.338 g cm-3 and lattice strength of about 230 MPa. Higher surface conductance of Au/PET by ζ-potential measurement was found. Ordinary and extraordinary refractive index of uniaxial pristine PET was obtained in spectral range from 4 to 6 eV. Optical determination (ellipsometry) of Au layer thickness 19.4 nm was in good agreement with the estimated value of 20 nm (AFM). (en)
Title
  • Properties of Au nanolayer sputtered on polyethyleneterephthalate
  • Properties of Au nanolayer sputtered on polyethyleneterephthalate (en)
skos:prefLabel
  • Properties of Au nanolayer sputtered on polyethyleneterephthalate
  • Properties of Au nanolayer sputtered on polyethyleneterephthalate (en)
skos:notation
  • RIV/44555601:13440/10:00005507!RIV11-GA0-13440___
http://linked.open...avai/riv/aktivita
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  • P(GA106/09/0125), P(GAP108/10/1106), P(IAA400720710), P(KAN200100801), P(KAN400480701), P(LC06041), Z(MSM6046137302)
http://linked.open...iv/cisloPeriodika
  • 5
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 282906
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  • RIV/44555601:13440/10:00005507
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  • Polyethyleneterephthalate; Au sputtered layer; Optical and surface properties; Crystallic structure (en)
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  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [7EF0C9C9A761]
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  • Materials Letters
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http://linked.open...v/svazekPeriodika
  • 64
http://linked.open...iv/tvurceVysledku
  • Kolská, Zdeňka
  • Švorčík, Václav
  • Mistrík, Jan
  • Luxbacher, Thomas
http://linked.open...ain/vavai/riv/wos
  • 000274567200017
http://linked.open...n/vavai/riv/zamer
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  • 0167-577X
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  • 13440
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