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  • This paper presents the results of experimental studies of transport and noise characteristics of CdTe deterctors. The current – voltage (I-V) characteristics and noise spectral densities were measured at the room temperature in dark and illumination through the contact area. We found that in this sample are good ohmic contacts and then measured noise corresponds volume noise sources only. The dominant noise source is 1/f type. One sample met the criteria to assumed bz the Hooge model. The Hooge constant for this sample was found: 5.5x10^-2. This value is higher than 2x10^-3 proposed by the Hooge theory due to the contact noise sources. Nevertheless, this value is very close to the theoretical.
  • This paper presents the results of experimental studies of transport and noise characteristics of CdTe deterctors. The current – voltage (I-V) characteristics and noise spectral densities were measured at the room temperature in dark and illumination through the contact area. We found that in this sample are good ohmic contacts and then measured noise corresponds volume noise sources only. The dominant noise source is 1/f type. One sample met the criteria to assumed bz the Hooge model. The Hooge constant for this sample was found: 5.5x10^-2. This value is higher than 2x10^-3 proposed by the Hooge theory due to the contact noise sources. Nevertheless, this value is very close to the theoretical. (en)
Title
  • Photoconductivity of CdTe Semiconductor Radiation Detectors
  • Photoconductivity of CdTe Semiconductor Radiation Detectors (en)
skos:prefLabel
  • Photoconductivity of CdTe Semiconductor Radiation Detectors
  • Photoconductivity of CdTe Semiconductor Radiation Detectors (en)
skos:notation
  • RIV/00216305:26620/13:PU106476!RIV14-MSM-26620___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ED1.1.00/02.0068), P(ED2.1.00/03.0072), S
http://linked.open...iv/cisloPeriodika
  • 5
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 96086
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26620/13:PU106476
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  • CdTe, noise, reliability (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • IN - Indická republika
http://linked.open...ontrolniKodProRIV
  • [A26A302F9B17]
http://linked.open...i/riv/nazevZdroje
  • International Journal of Computer Science and Electronics Engineering
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http://linked.open...v/svazekPeriodika
  • 1
http://linked.open...iv/tvurceVysledku
  • Grmela, Lubomír
  • Šik, Ondřej
issn
  • 2320-401X
number of pages
http://localhost/t...ganizacniJednotka
  • 26620
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