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Description
  • Optical absorption and fluorescence spectra of poly[2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions, show a clearly distinguished differences (e. g. peak broadening and shifting), which could be used for a characterization of suspensions with different acetonitrile content. The DLS measurement of the suspensions prepared shows a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft non-contacting optical profilometer method, based on chromatic aberration was used to measure the thickness. AFM imaging of spin coated and EPD films shows film roughness of 20-40 nm and 40-80 nm, respectively. The film roughness of the EPD film seems to be less than the suspension particle size obtained by DLS method, due probably to the partial film dissolving by the presented in the suspension toluene.
  • Optical absorption and fluorescence spectra of poly[2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions, show a clearly distinguished differences (e. g. peak broadening and shifting), which could be used for a characterization of suspensions with different acetonitrile content. The DLS measurement of the suspensions prepared shows a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft non-contacting optical profilometer method, based on chromatic aberration was used to measure the thickness. AFM imaging of spin coated and EPD films shows film roughness of 20-40 nm and 40-80 nm, respectively. The film roughness of the EPD film seems to be less than the suspension particle size obtained by DLS method, due probably to the partial film dissolving by the presented in the suspension toluene. (en)
Title
  • Characterization of electrophoretic suspension for thin polymer film deposition
  • Characterization of electrophoretic suspension for thin polymer film deposition (en)
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  • Characterization of electrophoretic suspension for thin polymer film deposition
  • Characterization of electrophoretic suspension for thin polymer film deposition (en)
skos:notation
  • RIV/00216305:26310/12:PU100113!RIV13-MSM-26310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ME09059), R, Z(AV0Z40500505)
http://linked.open...iv/cisloPeriodika
  • 1
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
  • Vala, Martin
  • Mladenova, Daniela
  • Ouzzane, Imad
  • Zhivkov, Ivaylo
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 126813
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26310/12:PU100113
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • thin films, poly(p-phenylenevinylene), PPV, polymers, electrophoretic deposition, spin-coating (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [CD27797D2A6D]
http://linked.open...i/riv/nazevZdroje
  • Journal of Physics: Conference Series
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 356
http://linked.open...iv/tvurceVysledku
  • Mladenova, Daniela
  • Ouzzane, Imad
  • Vala, Martin
  • Weiter, Martin
  • Zhivkov, Ivaylo
http://linked.open...n/vavai/riv/zamer
issn
  • 1742-6596
number of pages
http://localhost/t...ganizacniJednotka
  • 26310
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