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Description
| - The doctoral thesis deals with the study of surface properties of single-layer and multilayer thin films deposited from of vinyltriethoxysilane and tetravinylsilane monomers. It also deals with adhesion characterization of single layer tetravinylsilane films. The plasma polymerized thin films were prepared under steady-state deposition conditions on polished silicon wafers using plasma-enhanced chemical vapor deposition. The surface properties of the films were been characterized by different scanning probe microscopy methods and nanoindentation techniques such as conventional depth-sensing nanoindentation and load-partialunload (cyclic) nanoindentation. While, the nanoscratch test was used to characterize the film adhesion properties. Single layer films prepared at different deposition conditions were characterized with respect to surface morphology and mechanical properties (Youngs modulus and hardness). The results of surface morphology, grain analysis, nanoindentation, finite elemental analysis an
- The doctoral thesis deals with the study of surface properties of single-layer and multilayer thin films deposited from of vinyltriethoxysilane and tetravinylsilane monomers. It also deals with adhesion characterization of single layer tetravinylsilane films. The plasma polymerized thin films were prepared under steady-state deposition conditions on polished silicon wafers using plasma-enhanced chemical vapor deposition. The surface properties of the films were been characterized by different scanning probe microscopy methods and nanoindentation techniques such as conventional depth-sensing nanoindentation and load-partialunload (cyclic) nanoindentation. While, the nanoscratch test was used to characterize the film adhesion properties. Single layer films prepared at different deposition conditions were characterized with respect to surface morphology and mechanical properties (Youngs modulus and hardness). The results of surface morphology, grain analysis, nanoindentation, finite elemental analysis an (en)
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Title
| - STUDY OF THIN-FILM SURFACES
- STUDY OF THIN-FILM SURFACES (en)
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skos:prefLabel
| - STUDY OF THIN-FILM SURFACES
- STUDY OF THIN-FILM SURFACES (en)
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skos:notation
| - RIV/00216305:26310/11:PU96927!RIV13-AV0-26310___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GD104/09/H080), P(KAN101120701), P(ME09061)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26310/11:PU96927
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - plasma polymer, multilayer film, scanning probe microscopy, atomic force microscopy, conventional nanoindentation, cyclic nanoindentation, adhesion, scratch test (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
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http://localhost/t...ganizacniJednotka
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