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Description
  • Byly stanoveny disperzní křivky indexu lomu a extinkčního koeficientu pro pp-TVS vrstvy proměřené spektroskopickou elipsometrií. (cs)
  • We have focused on characterization of plasma polymer films using spectroscopic ellipsometry in this work. The determination of dispersion curves of the refractive index and extinction coefficient for films deposited at different process parameters has been the primary aim of our study.
  • We have focused on characterization of plasma polymer films using spectroscopic ellipsometry in this work. The determination of dispersion curves of the refractive index and extinction coefficient for films deposited at different process parameters has been the primary aim of our study. (en)
Title
  • Characterization of pp-TVS films by spectroscopic ellipsometry
  • Characterization of pp-TVS films by spectroscopic ellipsometry (en)
  • Charakterizace pp-TVS vrstev pomocí spektroskopické elipsometrie (cs)
skos:prefLabel
  • Characterization of pp-TVS films by spectroscopic ellipsometry
  • Characterization of pp-TVS films by spectroscopic ellipsometry (en)
  • Charakterizace pp-TVS vrstev pomocí spektroskopické elipsometrie (cs)
skos:notation
  • RIV/00216305:26310/06:PU63331!RIV07-MSM-26310___
http://linked.open...avai/riv/aktivita
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  • P(1P05OC087), P(GA104/06/0437)
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  • 468414
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  • RIV/00216305:26310/06:PU63331
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  • ellipsometry thin film plasma polymerization (en)
http://linked.open.../riv/klicoveSlovo
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  • [20EB5E42429E]
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  • Studýnka, Jan
  • Čech, Vladimír
  • Čechalová, Božena
http://localhost/t...ganizacniJednotka
  • 26310
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