About: The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In most of existing approaches, the reorganization of test vector sequence and reordering scan chains registers to reduce power consumption are solved separately, they are seen as independent procedures. In the paper it is shown that a  correlation between these two processes and strong reasons to combine them into one procedure run concurrently exist. Based on this idea, it is demonstrated that search spaces of both procedures can be combined together into a single search space in order to achieve better results during the optimization process. The optimization over the united search space was tested on ISCAS85, ISCAS89 and ITC99 benchmark circuits implemented by means of CMOS primitives from AMI technological libraries. Results presented in the paper show that lower power consumption can be achieved if the correlation is reflected, i.e., if the search space is united rather than divided into separate spaces. At the end of the paper, results achieved by genetic algorithm based optimization are p In most of existing approaches, the reorganization of test vector sequence and reordering scan chains registers to reduce power consumption are solved separately, they are seen as independent procedures. In the paper it is shown that a  correlation between these two processes and strong reasons to combine them into one procedure run concurrently exist. Based on this idea, it is demonstrated that search spaces of both procedures can be combined together into a single search space in order to achieve better results during the optimization process. The optimization over the united search space was tested on ISCAS85, ISCAS89 and ITC99 benchmark circuits implemented by means of CMOS primitives from AMI technological libraries. Results presented in the paper show that lower power consumption can be achieved if the correlation is reflected, i.e., if the search space is united rather than divided into separate spaces. At the end of the paper, results achieved by genetic algorithm based optimization are p (en)
Title	The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption (en)
skos:prefLabel	The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption (en)
skos:notation	RIV/00216305:26230/10:PU89622!RIV11-GA0-26230___
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(GA102/09/1668), S, Z(MSM0021630528)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Kotásek, Zdeněk Strnadel, Josef Škarvada, Jaroslav
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	294673
http://linked.open...ai/riv/idVysledku	RIV/00216305:26230/10:PU89622
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	test vector, scan chain, low power, power consumption, optimization, genetic algorithm, CMOS, AMI, ordering, correlation (en)
http://linked.open.../riv/klicoveSlovo	low power CMOS AMI correlation genetic algorithm optimization power consumption scan chain ordering test vector
http://linked.open...ontrolniKodProRIV	[6D1AC51BE35D]
http://linked.open...v/mistoKonaniAkce	Lille
http://linked.open...i/riv/mistoVydani	Los Alamitos
http://linked.open...i/riv/nazevZdroje	Proceedings of 13th Euromicro Conference on Digital System Design Architectures, Methods and Tools
http://linked.open...in/vavai/riv/obor	IN
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	SoC circuits reliability and availability improvement
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Kotásek, Zdeněk Strnadel, Josef Škarvada, Jaroslav
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-09-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Výzkum informačních technologií z hlediska bezpečnosti
number of pages	8 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IEEE Computer Society
https://schema.org/isbn	978-0-7695-4171-6
http://localhost/t...ganizacniJednotka	26230

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