About: The Use of Genetic Algorithm to Reduce Power Consumption during Test Application

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues are the ordering of test vectors and scan registers with the goal of reducing switching activity during test application and power consumption as a consequence of the ordering. The principles of developing an optimizing procedure with the aim of achieving a solution satisfying the required value of power consumption during power consumption are described here. A basic description of the methodology together with the functions needed to implement the procedures is provided. Experimental results are also discussed. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues are the ordering of test vectors and scan registers with the goal of reducing switching activity during test application and power consumption as a consequence of the ordering. The principles of developing an optimizing procedure with the aim of achieving a solution satisfying the required value of power consumption during power consumption are described here. A basic description of the methodology together with the functions needed to implement the procedures is provided. Experimental results are also discussed. (en)
Title	The Use of Genetic Algorithm to Reduce Power Consumption during Test Application The Use of Genetic Algorithm to Reduce Power Consumption during Test Application (en)
skos:prefLabel	The Use of Genetic Algorithm to Reduce Power Consumption during Test Application The Use of Genetic Algorithm to Reduce Power Consumption during Test Application (en)
skos:notation	RIV/00216305:26230/10:PU89621!RIV11-GA0-26230___
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(GA102/09/1668), S, Z(MSM0021630528)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Kotásek, Zdeněk Strnadel, Josef Škarvada, Jaroslav
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	294674
http://linked.open...ai/riv/idVysledku	RIV/00216305:26230/10:PU89621
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	test application, power consumption, reduction, optimization, genetic algorithm, scan chain, scan register,&nbsp,test vector, reordering, benchmark, digital circuit (en)
http://linked.open.../riv/klicoveSlovo	digital circuit benchmark genetic algorithm optimization reduction power consumption reordering scan chain test vector &nbsp scan register test application
http://linked.open...ontrolniKodProRIV	[967705EE356B]
http://linked.open...v/mistoKonaniAkce	York
http://linked.open...i/riv/mistoVydani	Berlin
http://linked.open...i/riv/nazevZdroje	Evolvable Systems: From Biology to Hardware
http://linked.open...in/vavai/riv/obor	IN
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	SoC circuits reliability and availability improvement
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Kotásek, Zdeněk Strnadel, Josef Škarvada, Jaroslav
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-09-06 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Výzkum informačních technologií z hlediska bezpečnosti
number of pages	14 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Springer-Verlag
https://schema.org/isbn	978-3-642-15322-8
http://localhost/t...ganizacniJednotka	26230

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