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  • Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a customer. Estimation of testability parameter strongly depends on how accurate information utilized for the estimation by a testability analysis method is. In the paper, two results of our previous, long-term research in the area of digital circuit testability analysis are summarized: principle of our testability analysis engine and libraries used to store the information outgoing from transparency models. The engine is general and the run-time and accuracy of its results strongly depends on the information stored in the libraries. If simple transparency model is utilized, information about circuit testability could be far away from real state of the circuit. Otherwise, testability information can approximate so serious parameter such as fault-coverage factor.
  • Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a customer. Estimation of testability parameter strongly depends on how accurate information utilized for the estimation by a testability analysis method is. In the paper, two results of our previous, long-term research in the area of digital circuit testability analysis are summarized: principle of our testability analysis engine and libraries used to store the information outgoing from transparency models. The engine is general and the run-time and accuracy of its results strongly depends on the information stored in the libraries. If simple transparency model is utilized, information about circuit testability could be far away from real state of the circuit. Otherwise, testability information can approximate so serious parameter such as fault-coverage factor. (en)
Title
  • TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path
  • TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path (en)
skos:prefLabel
  • TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path
  • TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path (en)
skos:notation
  • RIV/00216305:26230/08:PU76719!RIV10-MSM-26230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM0021630528)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 399043
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26230/08:PU76719
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • digital, circuit, testability, analysis, scan, transparency, netlist, graph, model, searching, marking, reachability, library, component, template (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [23088FAF0521]
http://linked.open...v/mistoKonaniAkce
  • Parma
http://linked.open...i/riv/mistoVydani
  • Los Alamitos
http://linked.open...i/riv/nazevZdroje
  • Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Strnadel, Josef
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • IEEE Computer Society
https://schema.org/isbn
  • 978-0-7695-3277-6
http://localhost/t...ganizacniJednotka
  • 26230
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