About: FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties     Goto   Sponge   NotDistinct   Permalink

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  • In the paper, the FITTest_BENCH06 set of synthetic benchmark circuits is presented for the evaluation of diagnostic methods and tools. The structure of benchmark circuits together with their diagnostic properties is described. The set consists of 31 circuits at various levels of complexity (2000, 10000, 28000, 100000, 150000 and 300000 gates). Four circuits with different diagnostic properties are available for each level of circuit complexity (fault coverage is approx. 0%, 33%, 66% and 100%). The benchmark circuits are available both at the register transfer level and the gate level. In addition to the benchmark set, a method is described that was used to develop benchmark circuits with required complexity and diagnostic properties.
  • In the paper, the FITTest_BENCH06 set of synthetic benchmark circuits is presented for the evaluation of diagnostic methods and tools. The structure of benchmark circuits together with their diagnostic properties is described. The set consists of 31 circuits at various levels of complexity (2000, 10000, 28000, 100000, 150000 and 300000 gates). Four circuits with different diagnostic properties are available for each level of circuit complexity (fault coverage is approx. 0%, 33%, 66% and 100%). The benchmark circuits are available both at the register transfer level and the gate level. In addition to the benchmark set, a method is described that was used to develop benchmark circuits with required complexity and diagnostic properties. (en)
  • V příspěvku je představena sada syntetických testovacích obvodů FITTest_BENCH06 určená pro ověřování diagnostických metod a nástrojů. Sada se skládá z 31 obvodů na čtyřech úrovních složitosti (2000, 10000, 28000, 100000, 150000 a 300000 hradel), přičemž pro každou úroveň složitosti jsou k dispozici 4 úrovně testovatelnosti (pokrytí poruch 0%, 33%, 66% a 100%). Součástí příspěvku je také krátké představení návrhové metody použité pro vytvoření těcto obvodů. (cs)
Title
  • FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties
  • FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties (en)
  • FITTest_BENCH06: Nová sada testovacích obvodů zohledňující jejich testovatelnost (cs)
skos:prefLabel
  • FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties
  • FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties (en)
  • FITTest_BENCH06: Nová sada testovacích obvodů zohledňující jejich testovatelnost (cs)
skos:notation
  • RIV/00216305:26230/06:PU66893!RIV07-GA0-26230___
http://linked.open.../vavai/riv/strany
  • 285-289
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/04/0737), P(GD102/05/H050)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 475965
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26230/06:PU66893
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • benchmark, synthetic, RTL, testability (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [FE4836527D89]
http://linked.open...v/mistoKonaniAkce
  • Praha
http://linked.open...i/riv/mistoVydani
  • Praha
http://linked.open...i/riv/nazevZdroje
  • Proc. of 2006 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Kotásek, Zdeněk
  • Sekanina, Lukáš
  • Pečenka, Tomáš
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • IEEE Computer Society
https://schema.org/isbn
  • 1-4244-0184-4
http://localhost/t...ganizacniJednotka
  • 26230
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