About: Local spectroscopy by scanning near-field optical microscopy

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The photoluminescence (PL) spectroscopy has for a long time been established as a very efficient, nondestructive technique for the evaluation of semiconductor materials and heterostructures. At room temperature, the band-gap-energy of ternary and quaternary epitaxial layers can be determined from the position of the PL peak, and the half-width of the PL curve is correlated with the free-carrier concentration. Both these parameters are important for the preparation of new epitaxial layers and structures for optoelectronic devices and applications. The comparison of PL obtained in the Near-field optical region and corresponding electroluminescent spectra in the Far-field from diodes based on investigated material helps to analyze the relative contributions - of the material luminescence (PL), and - the wave-guiding properties of the heterostructure, to the spectrum emitted from the diode edge. The photoluminescence (PL) spectroscopy has for a long time been established as a very efficient, nondestructive technique for the evaluation of semiconductor materials and heterostructures. At room temperature, the band-gap-energy of ternary and quaternary epitaxial layers can be determined from the position of the PL peak, and the half-width of the PL curve is correlated with the free-carrier concentration. Both these parameters are important for the preparation of new epitaxial layers and structures for optoelectronic devices and applications. The comparison of PL obtained in the Near-field optical region and corresponding electroluminescent spectra in the Far-field from diodes based on investigated material helps to analyze the relative contributions - of the material luminescence (PL), and - the wave-guiding properties of the heterostructure, to the spectrum emitted from the diode edge. (en) Spektroskopická měření fotoluminiscence byla dlouhou dobu považována za velmi účinnou nedestruktivní techniku pro zjišťování vlastností polovodičových rozhraní.S nástupem optického rastrovacího tunelového mikroskopu je možné provádět tato měření v pokojové teplotě a normýlním tlaku. Článek přináší porovnání fotoluminiscenčních spekter v blízké a vzdálené optické oblasti a ukazuje na některé z předností měření v blízkém poli. (cs)
Title	Local spectroscopy by scanning near-field optical microscopy Local spectroscopy by scanning near-field optical microscopy (en) Lokální spektroskopie pomocí optického rastrovacího mikroskopu v blízkém poli (cs)
skos:prefLabel	Local spectroscopy by scanning near-field optical microscopy Local spectroscopy by scanning near-field optical microscopy (en) Lokální spektroskopie pomocí optického rastrovacího mikroskopu v blízkém poli (cs)
skos:notation	RIV/00216305:26220/98:PU37576!RIV/2005/GA0/262205/N
http://linked.open.../vavai/riv/strany	215-218
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GV101/97/K009)
http://linked.open...iv/cisloPeriodika	3
http://linked.open...vai/riv/dodaniDat	2005
http://linked.open...aciTvurceVysledku	Létal, Petr Tománek, Pavel Grmela, Lubomír Brüstlová, Jitka Dobis, Pavel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	772936
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/98:PU37576
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	photoluminescence, local characteristics, SNOM, (en)
http://linked.open.../riv/klicoveSlovo	photoluminescence local characteristics SNOM
http://linked.open...odStatuVydavatele	CZ - Česká republika
http://linked.open...ontrolniKodProRIV	[9F09BBB65A5E]
http://linked.open...i/riv/nazevZdroje	Inženýrská mechanika
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Scientific center of nanotechnologies and surface engineering
http://linked.open...UplatneniVysledku	1998
http://linked.open...v/svazekPeriodika	5
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Tománek, Pavel Dobis, Pavel Brüstlová, Jitka Létal, Petr
issn	1210-2717
number of pages	4 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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