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  • Low frequency noise characteristics of GaN/AlGaN HFET structures were measured in wide temperature range and activation energy of traps were determined by several methods.
  • Low frequency noise characteristics of GaN/AlGaN HFET structures were measured in wide temperature range and activation energy of traps were determined by several methods. (en)
Title
  • Activation energy of traps in GaN HFETs
  • Activation energy of traps in GaN HFETs (en)
skos:prefLabel
  • Activation energy of traps in GaN HFETs
  • Activation energy of traps in GaN HFETs (en)
skos:notation
  • RIV/00216305:26220/13:PU106798!RIV14-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • S
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...iv/duvernostUdaju
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  • 59387
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/13:PU106798
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • trap, GaN, HFET, activation energy, RTS noise (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [89D69FF06BF7]
http://linked.open...v/mistoKonaniAkce
  • Montpellier, France
http://linked.open...i/riv/mistoVydani
  • Montpellier
http://linked.open...i/riv/nazevZdroje
  • Proceedings of 22nd International Conference on Noise and Fluctuations ICNF 2013, IEEE Catalog Number: CFP1392N-POD
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http://linked.open...ichTvurcuVysledku
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http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Pavelka, Jan
  • Tacano, Munecazu
  • Šikula, Josef
  • Tanuma, Nobuhisa
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
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  • IEEE
https://schema.org/isbn
  • 978-1-4799-0668-0
http://localhost/t...ganizacniJednotka
  • 26220
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