About: Microstructure defects in silicon solar cells

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Parameters of silicon semiconductor devices are affected by the presence of defects. For the improvement of parameters and lifetime of the devices, the defect localization and characterization is important. This paper describes defects in large semiconductor devices, i.e. in crystalline silicon solar cell structure. The majority of defects has been investigated and localized using visible light emission under reversed bias measurements on microscale. Defects having impact on the sample current-voltage plot and reversed bias light emission characteristics are shown together with the micrographs of defective surface areas. Particular defects such as nonlinearity and local breakdown in current voltage plot were found in the solar cell structure. The most of the defects is associated with the surface inhomogenity but not all surface inhomogenities act as defects. Measurement at various temperatures allows identify the breakdown mechanism of the investigated defects. Parameters of silicon semiconductor devices are affected by the presence of defects. For the improvement of parameters and lifetime of the devices, the defect localization and characterization is important. This paper describes defects in large semiconductor devices, i.e. in crystalline silicon solar cell structure. The majority of defects has been investigated and localized using visible light emission under reversed bias measurements on microscale. Defects having impact on the sample current-voltage plot and reversed bias light emission characteristics are shown together with the micrographs of defective surface areas. Particular defects such as nonlinearity and local breakdown in current voltage plot were found in the solar cell structure. The most of the defects is associated with the surface inhomogenity but not all surface inhomogenities act as defects. Measurement at various temperatures allows identify the breakdown mechanism of the investigated defects. (en)
Title	Microstructure defects in silicon solar cells Microstructure defects in silicon solar cells (en)
skos:prefLabel	Microstructure defects in silicon solar cells Microstructure defects in silicon solar cells (en)
skos:notation	RIV/00216305:26220/13:PU106135!RIV14-GA0-26220___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED1.1.00/02.0068), P(GAP102/11/0995), P(LH11060)
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Šicner, Jiří Tománek, Pavel Grmela, Lubomír Koktavý, Pavel Macků, Robert Vondra, Marek Dallaeva, Dinara
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	88247
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/13:PU106135
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	solar cell, silicon, defect, inhomogeneity, breakdown, microsctructure, measurement (en)
http://linked.open.../riv/klicoveSlovo	defect inhomogeneity breakdown measurement silicon solar cell microsctructure
http://linked.open...ontrolniKodProRIV	[B9C7D0E7025E]
http://linked.open...v/mistoKonaniAkce	Snolenice
http://linked.open...i/riv/mistoVydani	Bratislava
http://linked.open...i/riv/nazevZdroje	Proceedings of 8th Solid state surfaces and intefaces
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	8 (xsd:int)
http://linked.open...cetTvurcuVysledku	9 (xsd:int)
http://linked.open...vavai/riv/projekt	Study of local electronic and optical characteristics of solar cells Central european institute of technology Electron transport, Noise and Diagnostic of Shottky and Autoemission Cathodes
http://linked.open...UplatneniVysledku	2013
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Koktavý, Pavel Macků, Robert Tománek, Pavel Šicner, Jiří Škarvada, Pavel Dallaeva, Dinara Vondra, Marek Smith, Steve J.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2013-11-18 (xsd:date)
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Univerzita Komenského v Bratislave
https://schema.org/isbn	978-80-223-3501-0
http://localhost/t...ganizacniJednotka	26220

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