About: %22Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100 C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing. (en) Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing. Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing. (cs)
Title	%22Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors %22Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors (en) %22Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors (cs)
skos:prefLabel	%22Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors %22Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors (en) %22Effect of High Operating Temperature on Electrical Quantities of CdTe Radiation Detectors (cs)
skos:notation	RIV/00216305:26220/13:PU105018!RIV14-MSM-26220___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED2.1.00/03.0072)
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Grmela, Lubomír Trčka, Tomáš Šik, Ondřej Vondra, Marek
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	71542
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/13:PU105018
http://linked.open...riv/jazykVysledku	cze - čeština
http://linked.open.../riv/klicovaSlova	CdTe, šum, spolehlivost (en)
http://linked.open.../riv/klicoveSlovo	šum CdTe spolehlivost
http://linked.open...ontrolniKodProRIV	[4DDF88293AC8]
http://linked.open...v/mistoKonaniAkce	Kuala Lumpur
http://linked.open...i/riv/mistoVydani	Kuala Lumpur, Malaisie
http://linked.open...i/riv/nazevZdroje	Proc. of the Second Intl. Conf. on Advances in Electronic Devices and Circuits
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Centre of sensor, information and communication systems
http://linked.open...UplatneniVysledku	2013
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Trčka, Tomáš Šik, Ondřej Vondra, Marek
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2013-05-03 (xsd:date)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Institute of Research Engineers and Doctors
https://schema.org/isbn	978-981-07-6261-2
http://localhost/t...ganizacniJednotka	26220

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