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Description
  • The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum.
  • The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum. (en)
Title
  • MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS
  • MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS (en)
skos:prefLabel
  • MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS
  • MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS (en)
skos:notation
  • RIV/00216305:26220/12:PU99175!RIV13-GA0-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GAP102/10/2013), P(GD102/09/H074)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 150398
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/12:PU99175
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Solar cell, local defect, nondestructive testing. (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [830EC97BC6DC]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • Electronic Devices and Systems IMAPS CS International Conference 2012
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Koktavý, Pavel
  • Macků, Robert
  • Šicner, Jiří
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • LITERA
https://schema.org/isbn
  • 978-80-214-4539-0
http://localhost/t...ganizacniJednotka
  • 26220
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