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  • The complex permittivity of thin oxide film in commercial niobium oxide capacitor was measured in the temperature range 218 – 373 K by using Janis cryostat system, with HP4284A impedance analyzer at frequencies from 20 Hz to 1 MHz. Dielectric relaxation was observed in the range 218 – 373 K with the activation energy 0.055 eV. The real part of complex permittivity increases with temperature and decreases with frequency, whereas the imaginary part of complex permittivity displays a broad maximum peak whose position shifts with temperature to a higher frequency region. The measured imaginary parts of complex permittivity of thin oxide film were studied by the graphical analysis of the obtained data as proposed by Havriliak and Negami (HN) equation; we found that HN equation can very well fit the observed dielectric loss as a function of frequency except for slight deviations of observed values from the fitting curve at low frequencies. This slight deviation may be due to dc conductivity. The width p
  • The complex permittivity of thin oxide film in commercial niobium oxide capacitor was measured in the temperature range 218 – 373 K by using Janis cryostat system, with HP4284A impedance analyzer at frequencies from 20 Hz to 1 MHz. Dielectric relaxation was observed in the range 218 – 373 K with the activation energy 0.055 eV. The real part of complex permittivity increases with temperature and decreases with frequency, whereas the imaginary part of complex permittivity displays a broad maximum peak whose position shifts with temperature to a higher frequency region. The measured imaginary parts of complex permittivity of thin oxide film were studied by the graphical analysis of the obtained data as proposed by Havriliak and Negami (HN) equation; we found that HN equation can very well fit the observed dielectric loss as a function of frequency except for slight deviations of observed values from the fitting curve at low frequencies. This slight deviation may be due to dc conductivity. The width p (en)
Title
  • MEASUREMENT OF THE TEMPERATURE DEPENDENCE OF COMPLEX PERMITTIVITY AT DIFFERENT FREQUENCIES FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITORS
  • MEASUREMENT OF THE TEMPERATURE DEPENDENCE OF COMPLEX PERMITTIVITY AT DIFFERENT FREQUENCIES FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITORS (en)
skos:prefLabel
  • MEASUREMENT OF THE TEMPERATURE DEPENDENCE OF COMPLEX PERMITTIVITY AT DIFFERENT FREQUENCIES FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITORS
  • MEASUREMENT OF THE TEMPERATURE DEPENDENCE OF COMPLEX PERMITTIVITY AT DIFFERENT FREQUENCIES FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITORS (en)
skos:notation
  • RIV/00216305:26220/12:PU101494!RIV13-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ED2.1.00/03.0072), S
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 148979
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/12:PU101494
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • electrolytic capacitor, niobium pentoxide, dielectric spectrum, permittivity, temperature dependence (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [6BEBC11E87F9]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • New Trends in Physics, Nové trendy ve fyzice, NTF 2012
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Abuetwirat, Inas Faisel
  • Liedermann, Karel
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Vysoké učení technické v Brně
https://schema.org/isbn
  • 978-80-214-4594-9
http://localhost/t...ganizacniJednotka
  • 26220
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