About: IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after life testing fo Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after life testing fo (en)
Title	IONS ELECTROMIGRATION IN TANTALUM CAPACITORS IONS ELECTROMIGRATION IN TANTALUM CAPACITORS (en)
skos:prefLabel	IONS ELECTROMIGRATION IN TANTALUM CAPACITORS IONS ELECTROMIGRATION IN TANTALUM CAPACITORS (en)
skos:notation	RIV/00216305:26220/12:PU101138!RIV14-MSM-26220___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(EE2.3.09.0214)
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Majzner, Jiří Sedláková, Vlasta Šikula, Josef Zedníček, Tomáš
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	142996
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/12:PU101138
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Electro migration, mobile ions, tantalum capacitors, leakage current, MIS model (en)
http://linked.open.../riv/klicoveSlovo	leakage current Electro migration MIS model mobile ions tantalum capacitors
http://linked.open...ontrolniKodProRIV	[E0B66A05EBD0]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Neuveden
http://linked.open...i/riv/nazevZdroje	EDS 2012 Proceedings
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Incubator of research teams in Physical Electronics and Nanotechnology
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Majzner, Jiří Sedláková, Vlasta Šikula, Josef Zedníček, Tomáš Teverovsky, Dr. Alexander
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2012-06-28 (xsd:date)
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IMAPS CZ&SK
https://schema.org/isbn	978-80-214-4539-0
http://localhost/t...ganizacniJednotka	26220

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