About: Evaluation of piezoresistive ceramic pressure sensors using noise measurements

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The development of low-temperature co-fired ceramic (LTCC) technology is increasing the interest in ceramic pressure sensors (CPS). This technology and materials in combination with conventional thick-film technology offers a feasible solution to increase the sensitivity of pressure sensors and the flexibility in design, both with the aim to replace silicon-based pressure sensors in some applications. The sensor characteristics, i.e., offset stability and sensitivity, are always influenced by the level of electronic noise. We are concentrating our efforts on the use of low-frequency noise as a diagnostic tool for a reliability improvement and sensitivity increase. 1/f noise is dominant in the low-frequency region. It is given by two components; one is connected to the material structure and the second one is influenced by the defects and imperfection in the structure. The measurements of the electronic noise level could be used for an evaluation of different technologies in order to tune the pressure The development of low-temperature co-fired ceramic (LTCC) technology is increasing the interest in ceramic pressure sensors (CPS). This technology and materials in combination with conventional thick-film technology offers a feasible solution to increase the sensitivity of pressure sensors and the flexibility in design, both with the aim to replace silicon-based pressure sensors in some applications. The sensor characteristics, i.e., offset stability and sensitivity, are always influenced by the level of electronic noise. We are concentrating our efforts on the use of low-frequency noise as a diagnostic tool for a reliability improvement and sensitivity increase. 1/f noise is dominant in the low-frequency region. It is given by two components; one is connected to the material structure and the second one is influenced by the defects and imperfection in the structure. The measurements of the electronic noise level could be used for an evaluation of different technologies in order to tune the pressure (en)
Title	Evaluation of piezoresistive ceramic pressure sensors using noise measurements Evaluation of piezoresistive ceramic pressure sensors using noise measurements (en)
skos:prefLabel	Evaluation of piezoresistive ceramic pressure sensors using noise measurements Evaluation of piezoresistive ceramic pressure sensors using noise measurements (en)
skos:notation	RIV/00216305:26220/12:PU100136!RIV13-GA0-26220___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED2.1.00/03.0072), P(GD102/09/H074), P(MEB091129)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Majzner, Jiří Sedlák, Petr Sedláková, Vlasta Šikula, Josef Kopecký, Martin
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	135147
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/12:PU100136
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	LTCC, noise spectral density, sensitivity, resolution (en)
http://linked.open.../riv/klicoveSlovo	noise spectral density resolution sensitivity LTCC
http://linked.open...odStatuVydavatele	SI - Slovinská republika
http://linked.open...ontrolniKodProRIV	[FBC0A5138318]
http://linked.open...i/riv/nazevZdroje	Informacije MIDEM
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...vavai/riv/projekt	Centre of sensor, information and communication systems Diagnostics of material defects using the latest defectoscopic methods Investigation of the noise of thick-film pressure sensors
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	42
http://linked.open...iv/tvurceVysledku	Kopecký, Martin Majzner, Jiří Sedlák, Petr Sedláková, Vlasta Šikula, Josef Belavic, Darko Hrovat, Marko Santo-Zarnik, Marina
issn	0352-9045
number of pages	6 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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