About: Local measurement of solar cell emission characteristics

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial dama Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial dama (en)
Title	Local measurement of solar cell emission characteristics Local measurement of solar cell emission characteristics (en)
skos:prefLabel	Local measurement of solar cell emission characteristics Local measurement of solar cell emission characteristics (en)
skos:notation	RIV/00216305:26220/11:PU95007!RIV12-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GAP102/10/2013), P(LH11060), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika	8306
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Tománek, Pavel Grmela, Lubomír
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	209798
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/11:PU95007
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	solar cell, defect characterization, light emission (en)
http://linked.open.../riv/klicoveSlovo	light emission defect characterization solar cell
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[89F383EB3285]
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Study of local electronic and optical characteristics of solar cells Fluctuation processes in PN junctions of solar cells
http://linked.open...UplatneniVysledku	2011
http://linked.open...v/svazekPeriodika	8036
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Tománek, Pavel Škarvada, Pavel
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
issn	0277-786X
number of pages	6 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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