About: Advantages of DOF's Continuous Matching in EIT Inverse Problem

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper proposes new possibilities to solve the electrical impedance tomography inverse problem. Usually, a set of voltage measurements is acquired from the boundaries of an investigated volume, whilst this is subjected to a sequence of low-frequency current patterns. To find unknown material property distribution inside investigated object we can use the deterministic approach only, but there is often problem in such cases to find the stable and accurate solutions. To improve the stability and the accuracy of electrical impedance tomography image reconstructions new algorithm was created. In recent years is very often used the Level Set method to identify regions with different image or material properties and to separate the regions with known and unknown conductivity value. New algorithm is based on both of standard Tikhonov Regularization method and Level Set method. Further are presented also obtained reconstruction results. This paper proposes new possibilities to solve the electrical impedance tomography inverse problem. Usually, a set of voltage measurements is acquired from the boundaries of an investigated volume, whilst this is subjected to a sequence of low-frequency current patterns. To find unknown material property distribution inside investigated object we can use the deterministic approach only, but there is often problem in such cases to find the stable and accurate solutions. To improve the stability and the accuracy of electrical impedance tomography image reconstructions new algorithm was created. In recent years is very often used the Level Set method to identify regions with different image or material properties and to separate the regions with known and unknown conductivity value. New algorithm is based on both of standard Tikhonov Regularization method and Level Set method. Further are presented also obtained reconstruction results. (en)
Title	Advantages of DOF's Continuous Matching in EIT Inverse Problem Advantages of DOF's Continuous Matching in EIT Inverse Problem (en)
skos:prefLabel	Advantages of DOF's Continuous Matching in EIT Inverse Problem Advantages of DOF's Continuous Matching in EIT Inverse Problem (en)
skos:notation	RIV/00216305:26220/10:PU87060!RIV11-MSM-26220___
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Kubásek, Radek Dědková, Jarmila Ostanina, Ksenia
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	245545
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/10:PU87060
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	inverse electrical impedance tomography, boundaries, level set, Tikhonov Regularization (en)
http://linked.open.../riv/klicoveSlovo	boundaries level set Tikhonov Regularization inverse electrical impedance tomography
http://linked.open...ontrolniKodProRIV	[D73351BCAC2B]
http://linked.open...v/mistoKonaniAkce	Xi'An, China
http://linked.open...i/riv/mistoVydani	Cambridge
http://linked.open...i/riv/nazevZdroje	PIERS 2010 in Xi'an Proceedings
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Kubásek, Radek Ostanina, Ksenia Dědková, Jarmila
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-03-22 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	978-1-934142-12-7
http://localhost/t...ganizacniJednotka	26220

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