About: OUTPUT AND TRANSFER CHARACTERISTICS AND NOISE ANALYSIS OF CMOS TECHNOLOGY

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: OUTPUT AND TRANSFER CHARACTERISTICS AND NOISE ANALYSIS OF CMOS TECHNOLOGY Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Pyroelectric infrared detectors convert the changes of incoming infrared light to electric signal. Pyroelectric materials are characterized by the spontaneous electric polarization, which is altered by temperature changes infrared light illuminates the elements. Since the measured sensor series uses this effect they can be used at ambient temperature even in the presence of thermal noise. By choosing appropriate IR receiving electrodes, they serve a wide range of applications. Sometimes pyroelectric infrared detectors generate a false alarm. They include thermal resistor and FET device which can be a source of random sig-nals. This paper deals with the measurement of output and transfer characteristics and low frequency voltage noise spectral density. By the help these characteristics we can evaluate detectors and reduce false alarms. Pyroelectric infrared detectors convert the changes of incoming infrared light to electric signal. Pyroelectric materials are characterized by the spontaneous electric polarization, which is altered by temperature changes infrared light illuminates the elements. Since the measured sensor series uses this effect they can be used at ambient temperature even in the presence of thermal noise. By choosing appropriate IR receiving electrodes, they serve a wide range of applications. Sometimes pyroelectric infrared detectors generate a false alarm. They include thermal resistor and FET device which can be a source of random sig-nals. This paper deals with the measurement of output and transfer characteristics and low frequency voltage noise spectral density. By the help these characteristics we can evaluate detectors and reduce false alarms. (en)
Title	OUTPUT AND TRANSFER CHARACTERISTICS AND NOISE ANALYSIS OF CMOS TECHNOLOGY OUTPUT AND TRANSFER CHARACTERISTICS AND NOISE ANALYSIS OF CMOS TECHNOLOGY (en)
skos:prefLabel	OUTPUT AND TRANSFER CHARACTERISTICS AND NOISE ANALYSIS OF CMOS TECHNOLOGY OUTPUT AND TRANSFER CHARACTERISTICS AND NOISE ANALYSIS OF CMOS TECHNOLOGY (en)
skos:notation	RIV/00216305:26220/10:PU86675!RIV11-GA0-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GD102/09/H074), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Tofel, Pavel Chvátal, Miloš
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	277749
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/10:PU86675
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	MOSFET, Pyroelectric Infrared Detector, Electron Density, RTS Noise (en)
http://linked.open.../riv/klicoveSlovo	Electron Density RTS Noise MOSFET Pyroelectric Infrared Detector
http://linked.open...ontrolniKodProRIV	[C26A122526CD]
http://linked.open...v/mistoKonaniAkce	FEKT VUT v Brně
http://linked.open...i/riv/mistoVydani	nám. Republiky 15 614 00 BRNO
http://linked.open...i/riv/nazevZdroje	PROCEEDINGS OF THE 16TH CONFERENCE STUDENT EEICT 2010 - Volume 5
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Tofel, Pavel Chvátal, Miloš
http://linked.open...vavai/riv/typAkce	CST - Celostátní
http://linked.open.../riv/zahajeniAkce	2010-04-29 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	5 (xsd:int)
http://purl.org/ne...btex#hasPublisher	NOVPRESS s.r.o.
https://schema.org/isbn	978-80-214-4079-1
http://localhost/t...ganizacniJednotka	26220

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 77 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software