About: THICK FILM RESISTORS NDT BY ELECTRO-ULTRASONIC SPECTROSCOPY

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The non-linear electro-ultrasonic spectroscopy was used as a non-destructive testing method for the polymer based and cermet thick film resistors evaluation. We carried out the correlation between this method and standard testing methods as noise spectroscopy and the third harmonic voltage measurements. The measuring set-up with the ultrasonic transducer working on the frequency range 10 kHz to 1 MHz was designed and realized. Proposed method is exploiting two different signal sources - ultrasonic wave and alternating electric current. Mechanical vibrations affect the defects in the sample structure and it influences the electric charge transport through the measured structure. Resulting information is measured on the differential frequency given by the superposition or subtraction of exciting signals frequencies. Low-pass filter with limit frequency 5 kHz was used for the suppression of exciting signals amplitudes. Measured sample together with the ultrasonic transducer creates the resonant system. F The non-linear electro-ultrasonic spectroscopy was used as a non-destructive testing method for the polymer based and cermet thick film resistors evaluation. We carried out the correlation between this method and standard testing methods as noise spectroscopy and the third harmonic voltage measurements. The measuring set-up with the ultrasonic transducer working on the frequency range 10 kHz to 1 MHz was designed and realized. Proposed method is exploiting two different signal sources - ultrasonic wave and alternating electric current. Mechanical vibrations affect the defects in the sample structure and it influences the electric charge transport through the measured structure. Resulting information is measured on the differential frequency given by the superposition or subtraction of exciting signals frequencies. Low-pass filter with limit frequency 5 kHz was used for the suppression of exciting signals amplitudes. Measured sample together with the ultrasonic transducer creates the resonant system. F (en)
Title	THICK FILM RESISTORS NDT BY ELECTRO-ULTRASONIC SPECTROSCOPY THICK FILM RESISTORS NDT BY ELECTRO-ULTRASONIC SPECTROSCOPY (en)
skos:prefLabel	THICK FILM RESISTORS NDT BY ELECTRO-ULTRASONIC SPECTROSCOPY THICK FILM RESISTORS NDT BY ELECTRO-ULTRASONIC SPECTROSCOPY (en)
skos:notation	RIV/00216305:26220/09:PU83436!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GD102/09/H074), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Tofel, Pavel Sedláková, Vlasta Šikula, Josef Kopecký, Martin
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	346259
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU83436
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Electro-ultrasonic, spectroscopy, resistance change, non-destructive testing (en)
http://linked.open.../riv/klicoveSlovo	non-destructive testing resistance change spectroscopy Electro-ultrasonic
http://linked.open...ontrolniKodProRIV	[1404802282C4]
http://linked.open...v/mistoKonaniAkce	Průhonice
http://linked.open...i/riv/mistoVydani	Neuveden
http://linked.open...i/riv/nazevZdroje	Vth workshop NDT in progress
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Hájek, Karel Kopecký, Martin Sedláková, Vlasta Tofel, Pavel Šikula, Josef
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-10-12 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	978-80-214-3968-9
http://localhost/t...ganizacniJednotka	26220

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