About: Chemical passivation of a silicon surface for minority carrier bulk-lifetime measurements

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solution, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution residues from a silicon surface, so that the parameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers in series in the production after a repetitive return of the measured wafer into the production process. The cleaning process itself is also a subject of a development. This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solution, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution residues from a silicon surface, so that the parameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers in series in the production after a repetitive return of the measured wafer into the production process. The cleaning process itself is also a subject of a development. (en) This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solution, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution residues from a silicon surface, so that the parameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers in series in the production after a repetitive return of the measured wafer into the production process. The cleaning process itself is also a subject of a development. (cs)
Title	Chemical passivation of a silicon surface for minority carrier bulk-lifetime measurements Chemical passivation of a silicon surface for minority carrier bulk-lifetime measurements (en) Chemical passivation of a silicon surface for minority carrier bulk-lifetime measurements (cs)
skos:prefLabel	Chemical passivation of a silicon surface for minority carrier bulk-lifetime measurements Chemical passivation of a silicon surface for minority carrier bulk-lifetime measurements (en) Chemical passivation of a silicon surface for minority carrier bulk-lifetime measurements (cs)
skos:notation	RIV/00216305:26220/09:PU83320!RIV10-GA0-26220___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA102/09/0859)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Macháček, Martin Boušek, Jaroslav Solčanský, Marek
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	306891
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU83320
http://linked.open...riv/jazykVysledku	cze - čeština
http://linked.open.../riv/klicovaSlova	passivation, lifetime, stability, quinhydrone (en)
http://linked.open.../riv/klicoveSlovo	lifetime passivation stability quinhydrone
http://linked.open...ontrolniKodProRIV	[1B896761C7DC]
http://linked.open...v/mistoKonaniAkce	Hamburg
http://linked.open...i/riv/mistoVydani	Hamburg.
http://linked.open...i/riv/nazevZdroje	24th European Photovoltaic Solar Energy Conference
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Local Light Emission in Association with Stochastic Processes in PN Junction in Solar Cells at Cryo Temperature.
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Poruba, Aleš Solčanský, Marek Boušek, Jaroslav Macháček, Martin
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2009-09-20 (xsd:date)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	3-936338-25-6
http://localhost/t...ganizacniJednotka	26220

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