About: Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Dielectric Relaxation Spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges, to the application of external electric field. The main information that can be extracted from the DRS is related to the molecular dynamics of dipole or loosely attached charge carriers. Therefore, DRS finds application in those fields where mobility of individual molecules, segments of molecules or separate chemical bonds or changes in chemical composition is involved - monitoring of hardening or swelling processes, analysis of glass transition, applications in degradation and ageing of materials based on disappearance or emergence of dipoles and charge-carriers. In the present research, we would like to apply the DRS for the study of thin oxide layers on noble metals. Current experimental equipment available in the Department of Physics, allowing measurements Dielectric Relaxation Spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges, to the application of external electric field. The main information that can be extracted from the DRS is related to the molecular dynamics of dipole or loosely attached charge carriers. Therefore, DRS finds application in those fields where mobility of individual molecules, segments of molecules or separate chemical bonds or changes in chemical composition is involved - monitoring of hardening or swelling processes, analysis of glass transition, applications in degradation and ageing of materials based on disappearance or emergence of dipoles and charge-carriers. In the present research, we would like to apply the DRS for the study of thin oxide layers on noble metals. Current experimental equipment available in the Department of Physics, allowing measurements (en)
Title	Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers (en)
skos:prefLabel	Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers (en)
skos:notation	RIV/00216305:26220/09:PU82502!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Liedermann, Karel Holcman, Vladimír Abuetwirat, Inas Faisel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	310408
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU82502
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Dielectrics, relaxation, molecular dynamics, spectroscopy, tantalum oxide (en)
http://linked.open.../riv/klicoveSlovo	relaxation spectroscopy tantalum oxide molecular dynamics Dielectrics
http://linked.open...ontrolniKodProRIV	[5FF7ED46C6FC]
http://linked.open...v/mistoKonaniAkce	Košice
http://linked.open...i/riv/mistoVydani	Košice, SLovenská republika
http://linked.open...i/riv/nazevZdroje	Physics of Materials 2009
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Abuetwirat, Inas Faisel Holcman, Vladimír Liedermann, Karel
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-10-14 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	FEI TU Košiče
https://schema.org/isbn	978-80-8086-122-3
http://localhost/t...ganizacniJednotka	26220

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 47 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software