About: Amplitude Analysis in Partial Discharge Measurement

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In commercial sphere, there is obvious the pursuit of produce electrical wares with high reliability and low risk of breakdown. It is known, the Partial Discharge (PD) is regarded as a parasitic effect occurring in insulating systems. Deep investigation of Partial Discharge activity is necessary for longer service life and better reliability of high voltage under stressed parts or systems. Due to dimension minimizing tendency the higher claims poses on insulating systems. The real insulating materials are non-ideal, they consist of some filthinesses and faults (air bubbles) causing the unequal voltage distribution and enhanced risk of breakdown. Relatively cheap measuring device working at amplitude analysis principle of partial discharge pulses was design to monitoring the partial discharge origin in hard to reach places of surveyed specimen. In commercial sphere, there is obvious the pursuit of produce electrical wares with high reliability and low risk of breakdown. It is known, the Partial Discharge (PD) is regarded as a parasitic effect occurring in insulating systems. Deep investigation of Partial Discharge activity is necessary for longer service life and better reliability of high voltage under stressed parts or systems. Due to dimension minimizing tendency the higher claims poses on insulating systems. The real insulating materials are non-ideal, they consist of some filthinesses and faults (air bubbles) causing the unequal voltage distribution and enhanced risk of breakdown. Relatively cheap measuring device working at amplitude analysis principle of partial discharge pulses was design to monitoring the partial discharge origin in hard to reach places of surveyed specimen. (en)
Title	Amplitude Analysis in Partial Discharge Measurement Amplitude Analysis in Partial Discharge Measurement (en)
skos:prefLabel	Amplitude Analysis in Partial Discharge Measurement Amplitude Analysis in Partial Discharge Measurement (en)
skos:notation	RIV/00216305:26220/09:PU82403!RIV11-MPO-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(2A-1TP1/143), P(GA102/08/1116), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Boušek, Jaroslav Háze, Jiří Havlíček, Tomáš
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	302659
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU82403
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Partial Discharge (PD), insulation system, high voltage (HV), HV stress, breakdown voltage, amplitude analysis of PD, PD measurement (en)
http://linked.open.../riv/klicoveSlovo	insulation system breakdown voltage HV stress amplitude analysis of PD high voltage (HV) PD measurement Partial Discharge (PD)
http://linked.open...ontrolniKodProRIV	[94EBE6DCEF8D]
http://linked.open...v/mistoKonaniAkce	Sliema
http://linked.open...i/riv/mistoVydani	Malta, Slilema
http://linked.open...i/riv/nazevZdroje	Proceedings of the Second International Conference on Advances in Circuits, Electronics and Micro-electronics CENICS 2009
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Research of novel mechatronic MEMS structures for pressure measurements Methods of Signal Digitizing for Advanced Sensors
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Havlíček, Tomáš Háze, Jiří Boušek, Jaroslav
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-10-10 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	IEEE Computer Society
https://schema.org/isbn	978-0-7695-3832-7
http://localhost/t...ganizacniJednotka	26220

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