About: Loss in the near-field optical microscopy due to the tapered probe

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Near-field optical techniques are presently widely used to study various optical characteristics of transparent or opaque microscopic structures such as optical waveguides, photonic crystals, semiconductor junctions, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered tiny optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source, detector, or both. Therefore it must be protected against mechanical vibration, cracks, etc. For its accurate simulation, it is essential that its geometry is correctly described, especially when coupling to evanescent field is considered. Near-field optical techniques are presently widely used to study various optical characteristics of transparent or opaque microscopic structures such as optical waveguides, photonic crystals, semiconductor junctions, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered tiny optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source, detector, or both. Therefore it must be protected against mechanical vibration, cracks, etc. For its accurate simulation, it is essential that its geometry is correctly described, especially when coupling to evanescent field is considered. (en)
Title	Loss in the near-field optical microscopy due to the tapered probe Loss in the near-field optical microscopy due to the tapered probe (en)
skos:prefLabel	Loss in the near-field optical microscopy due to the tapered probe Loss in the near-field optical microscopy due to the tapered probe (en)
skos:notation	RIV/00216305:26220/09:PU82387!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/08/1474), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Tománek, Pavel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	324145
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU82387
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	near field, optics, taper, dielectric coating (en)
http://linked.open.../riv/klicoveSlovo	optics near field taper dielectric coating
http://linked.open...ontrolniKodProRIV	[F399FE84117A]
http://linked.open...v/mistoKonaniAkce	Košice
http://linked.open...i/riv/mistoVydani	Košice, Slovensko
http://linked.open...i/riv/nazevZdroje	Proceedings Physics of Materials 09
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Local optical and electronic characterisation of optoelectronic structures with nanometric resolution
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Tománek, Pavel Škarvada, Pavel
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-10-14 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Technická univerzita v Košiciach
https://schema.org/isbn	978-80-8086-122-3
http://localhost/t...ganizacniJednotka	26220

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