About: Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper analyses in detail the issue of non-destructive testing of n+p silicon solar cells. Their extremely large junctions contain lots of defect regions which deteriorate the properties of the whole solar cells. In the present work, we carried out experiments and theoretical description for the bulk inhomogeneity of the samples qualification. We propose an equivalent circuit model for the current-voltage characteristics of forward biased n+p solar cells, too. The model takes into account leakage current, series resistance and different mechanisms of charge transport. Spread series resistance issue of a solar cell front contact has been discussed and experimentally demonstrated. The electrical model admits analytical solution using e.g. the Lambert W-function and it has been tested for some spices of a solar cell in forward direction. Last but not least we use obtained information for description of the samples noise behaviour and we suggest noise model containing flicker noise, shot noise and G-R This paper analyses in detail the issue of non-destructive testing of n+p silicon solar cells. Their extremely large junctions contain lots of defect regions which deteriorate the properties of the whole solar cells. In the present work, we carried out experiments and theoretical description for the bulk inhomogeneity of the samples qualification. We propose an equivalent circuit model for the current-voltage characteristics of forward biased n+p solar cells, too. The model takes into account leakage current, series resistance and different mechanisms of charge transport. Spread series resistance issue of a solar cell front contact has been discussed and experimentally demonstrated. The electrical model admits analytical solution using e.g. the Lambert W-function and it has been tested for some spices of a solar cell in forward direction. Last but not least we use obtained information for description of the samples noise behaviour and we suggest noise model containing flicker noise, shot noise and G-R (en)
Title	Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction (en)
skos:prefLabel	Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction (en)
skos:notation	RIV/00216305:26220/09:PU82317!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GD102/09/H074), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Koktavý, Pavel Macků, Robert
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	318809
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU82317
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Noise Spectroscopy, Silicon Solar Cell, Non-destructive Testing (en)
http://linked.open.../riv/klicoveSlovo	Non-destructive Testing Silicon Solar Cell Noise Spectroscopy
http://linked.open...ontrolniKodProRIV	[D9A677562D8C]
http://linked.open...v/mistoKonaniAkce	Hamburg
http://linked.open...i/riv/mistoVydani	Neuveden
http://linked.open...i/riv/nazevZdroje	Proceedings of 24rd European Photovoltaic Solar Energy Conference
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Koktavý, Pavel Macků, Robert
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2009-09-20 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	WIP-Renewable Energies
https://schema.org/isbn	3-936338-24-8
http://localhost/t...ganizacniJednotka	26220

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