About: Long Term Stability of Polymer Based Resistors Tested by Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The long term stability of polymer based thick film resistors was correlated with the results of standard testing methods: the low frequency noise measurements, non-linearity and new proposed method: Electro-Ultrasonic Spectroscopy. The samples were made using different resistive and conducting pastes. The resistive pastes were made using one type of conducting grains - carbon and graphite particles, suspended in different polymer vehicles. Contacts were made by polymer based dipping silver. The results of standard measuring methods are compared with those of the electro-ultrasonic spectroscopy. This method is based on the phonon interaction with conducting electrons and on the change of the contact area among the conducting particles. The ultrasonic signal changes the contact area between the conducting grains in the resistor structure and then the resistance is modulated by the frequency of ultrasonic excitation. Resultant intermodulation voltage appearing on the sample depends on the value of AC c The long term stability of polymer based thick film resistors was correlated with the results of standard testing methods: the low frequency noise measurements, non-linearity and new proposed method: Electro-Ultrasonic Spectroscopy. The samples were made using different resistive and conducting pastes. The resistive pastes were made using one type of conducting grains - carbon and graphite particles, suspended in different polymer vehicles. Contacts were made by polymer based dipping silver. The results of standard measuring methods are compared with those of the electro-ultrasonic spectroscopy. This method is based on the phonon interaction with conducting electrons and on the change of the contact area among the conducting particles. The ultrasonic signal changes the contact area between the conducting grains in the resistor structure and then the resistance is modulated by the frequency of ultrasonic excitation. Resultant intermodulation voltage appearing on the sample depends on the value of AC c (en)
Title	Long Term Stability of Polymer Based Resistors Tested by Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy Long Term Stability of Polymer Based Resistors Tested by Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy (en)
skos:prefLabel	Long Term Stability of Polymer Based Resistors Tested by Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy Long Term Stability of Polymer Based Resistors Tested by Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy (en)
skos:notation	RIV/00216305:26220/09:PU81661!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GD102/09/H074), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Tofel, Pavel Sedláková, Vlasta Šikula, Josef
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	324084
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU81661
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Low frequency noise, 1/f noise, non-linearity, polymer based TFR, electro-ultrasonic spectroscopy (en)
http://linked.open.../riv/klicoveSlovo	non-linearity electro-ultrasonic spectroscopy 1/f noise Low frequency noise polymer based TFR
http://linked.open...ontrolniKodProRIV	[DB873A1FE3E1]
http://linked.open...v/mistoKonaniAkce	Rimini
http://linked.open...i/riv/mistoVydani	Italie
http://linked.open...i/riv/nazevZdroje	17th European Microelectronics and Packaging Conference & Exhibition
http://linked.open...in/vavai/riv/obor	BE
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Sedláková, Vlasta Tofel, Pavel Šikula, Josef
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-06-15 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	5 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	978-1-4244-4722-0
http://localhost/t...ganizacniJednotka	26220

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