About: Electro Ultrasonic Spectroscopy of Cermet Thick Films

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The electro-ultrasonic spectroscopy is non-destructive testing method for cermet resistors. This method can be used as a diagnostic tool for the quality and reliability assessment. AC current varying with frequency fE and the ultrasonic signal varying with frequency fU are applied on the conducting sample and a new intermodulation signal on the frequency fm given by the superposition or subtraction of exciting frequencies is measured on the sample. The sample resistance is influenced by the ultrasonic signal. The ultrasonic signal changes the contact area between the conducting grains in the sample structure and then resistance is modulated by the frequency of ultrasonic excitation. The electrical charge and also the electrical current flowing through the sample structure are conserved. In case the contact area between the conducting grains is changing then the current density is changed. This leads to the resistivity change of measured structure. We suppose that for the sample with more defects in th The electro-ultrasonic spectroscopy is non-destructive testing method for cermet resistors. This method can be used as a diagnostic tool for the quality and reliability assessment. AC current varying with frequency fE and the ultrasonic signal varying with frequency fU are applied on the conducting sample and a new intermodulation signal on the frequency fm given by the superposition or subtraction of exciting frequencies is measured on the sample. The sample resistance is influenced by the ultrasonic signal. The ultrasonic signal changes the contact area between the conducting grains in the sample structure and then resistance is modulated by the frequency of ultrasonic excitation. The electrical charge and also the electrical current flowing through the sample structure are conserved. In case the contact area between the conducting grains is changing then the current density is changed. This leads to the resistivity change of measured structure. We suppose that for the sample with more defects in th (en)
Title	Electro Ultrasonic Spectroscopy of Cermet Thick Films Electro Ultrasonic Spectroscopy of Cermet Thick Films (en)
skos:prefLabel	Electro Ultrasonic Spectroscopy of Cermet Thick Films Electro Ultrasonic Spectroscopy of Cermet Thick Films (en)
skos:notation	RIV/00216305:26220/09:PU81550!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA106/07/1393), P(GD102/09/H074), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Tofel, Pavel Sedláková, Vlasta Šikula, Josef Chvátal, Miloš
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	312791
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU81550
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Cermet resistor, electro-ultrasonic spectroscopy, resistivity change (en)
http://linked.open.../riv/klicoveSlovo	electro-ultrasonic spectroscopy Cermet resistor resistivity change
http://linked.open...ontrolniKodProRIV	[9BBA81A2B108]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	32nd International Spring Seminar on Electronics Technology
http://linked.open...in/vavai/riv/obor	BE
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Nonlinear ultrasonic spectroscopy of magnesium metallic composits and alloys Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Sedláková, Vlasta Tofel, Pavel Šikula, Josef Chvátal, Miloš
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2009-05-13 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	978-1-4244-4260-7
http://localhost/t...ganizacniJednotka	26220

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