About: Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration

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About: Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Dielectric relaxation spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges to the application of external electric field. In the present research, we would like to apply the DRS for the study of physical and electrical properties of dielectric thin films. The important properties of dielectric materials, as dielectric contant and dielectric lossoften vary as temperature or frequence varies. Thus the operation range for applications varies accordingly. Dielectric relaxation spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges to the application of external electric field. In the present research, we would like to apply the DRS for the study of physical and electrical properties of dielectric thin films. The important properties of dielectric materials, as dielectric contant and dielectric lossoften vary as temperature or frequence varies. Thus the operation range for applications varies accordingly. (en)
Title	Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration (en)
skos:prefLabel	Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration (en)
skos:notation	RIV/00216305:26220/09:PU81089!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Abuetwirat, Inas Faisel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	310407
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU81089
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	dielectrics, relaxation, molecular dynamics, spectroscopy, dielectric thin film (en)
http://linked.open.../riv/klicoveSlovo	relaxation spectroscopy dielectrics molecular dynamics dielectric thin film
http://linked.open...ontrolniKodProRIV	[4646920C7C0A]
http://linked.open...v/mistoKonaniAkce	Králíky
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Proceedings of IEEE Workshop Králíky 2009
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Abuetwirat, Inas Faisel
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2009-08-31 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Novapres
https://schema.org/isbn	978-80-214-3938-2
http://localhost/t...ganizacniJednotka	26220

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