About: Spectral analysis of electromagnetic and acoustic emission stochastic signals

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Application of mechanical stress leads to micro-cracks formation in stressed solid dielectric materials. Generation of these cracks is accompanied by generation of the noise signals of electromagnetic (EME) and acoustic (AE) emission, which can be measured by appropriate sensors. Spectral analysis of these noise signals can be used for better diagnostics of mechanically stressed solid dielectric materials. The group of realizations with damp kvaziharmonic waveforms of EME signals is the most significant for analysis of the crack generation. In this special case, the crack walls make this characteristic type of moving, after the crack opening. This specific group of signals allows spectral analysis of measured EME and AE signals. The spectral analysis provides the better view of the crack generation and it allows study relations between EME and AE signals during this process (in the time and the frequency domain). Application of mechanical stress leads to micro-cracks formation in stressed solid dielectric materials. Generation of these cracks is accompanied by generation of the noise signals of electromagnetic (EME) and acoustic (AE) emission, which can be measured by appropriate sensors. Spectral analysis of these noise signals can be used for better diagnostics of mechanically stressed solid dielectric materials. The group of realizations with damp kvaziharmonic waveforms of EME signals is the most significant for analysis of the crack generation. In this special case, the crack walls make this characteristic type of moving, after the crack opening. This specific group of signals allows spectral analysis of measured EME and AE signals. The spectral analysis provides the better view of the crack generation and it allows study relations between EME and AE signals during this process (in the time and the frequency domain). (en)
Title	Spectral analysis of electromagnetic and acoustic emission stochastic signals Spectral analysis of electromagnetic and acoustic emission stochastic signals (en)
skos:prefLabel	Spectral analysis of electromagnetic and acoustic emission stochastic signals Spectral analysis of electromagnetic and acoustic emission stochastic signals (en)
skos:notation	RIV/00216305:26220/09:PU80973!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GD102/09/H074), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Koktavý, Pavel Trčka, Tomáš Koktavý, Bohumil
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	342871
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/09:PU80973
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	micro-cracks, electromagnetic emission, acoustic emission, spectral analysis (en)
http://linked.open.../riv/klicoveSlovo	spectral analysis acoustic emission electromagnetic emission micro-cracks
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[9A1059FE8F59]
http://linked.open...i/riv/nazevZdroje	AIP conference proceedings
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2009
http://linked.open...v/svazekPeriodika	1129
http://linked.open...iv/tvurceVysledku	Koktavý, Pavel Trčka, Tomáš Koktavý, Bohumil
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
issn	0094-243X
number of pages	4 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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