About: PC CONTROLED EQUIPMENT FOR FAST TRANSIENTS TESTING OF DIFFERENT TYPE SILICON SOLAR CELLS

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	A simple method using fast transients has been described in our previous work [1] and then demonstrated for the set of different quality photovoltaic solar cells [2]. Cells parameters as the reverse breakdown voltage, depletion layer width and junction capacitance, serial and parallel resistance and lifetime of minority carriers in bulk can be taken easily. New approach uses PC controlled equipment to drive the experiment and data acquisition. Collected data are then post-processed by a set of user programs. Whereas in case of monocrystalline and multicrystalline silicon cells there is a need for a large current to cell excitation and the lifetime of minority carriers in bulk is always larger than some tens of microseconds, in case of amorphous and microcrystalline test cells the area of the cell is usually much smaller and consequently the current needed is several orders lower. On the other hand because of very short lifetime of minority carriers in case of amorphous and microcrystalline silicone ce A simple method using fast transients has been described in our previous work [1] and then demonstrated for the set of different quality photovoltaic solar cells [2]. Cells parameters as the reverse breakdown voltage, depletion layer width and junction capacitance, serial and parallel resistance and lifetime of minority carriers in bulk can be taken easily. New approach uses PC controlled equipment to drive the experiment and data acquisition. Collected data are then post-processed by a set of user programs. Whereas in case of monocrystalline and multicrystalline silicon cells there is a need for a large current to cell excitation and the lifetime of minority carriers in bulk is always larger than some tens of microseconds, in case of amorphous and microcrystalline test cells the area of the cell is usually much smaller and consequently the current needed is several orders lower. On the other hand because of very short lifetime of minority carriers in case of amorphous and microcrystalline silicone ce (en)
Title	PC CONTROLED EQUIPMENT FOR FAST TRANSIENTS TESTING OF DIFFERENT TYPE SILICON SOLAR CELLS PC CONTROLED EQUIPMENT FOR FAST TRANSIENTS TESTING OF DIFFERENT TYPE SILICON SOLAR CELLS (en)
skos:prefLabel	PC CONTROLED EQUIPMENT FOR FAST TRANSIENTS TESTING OF DIFFERENT TYPE SILICON SOLAR CELLS PC CONTROLED EQUIPMENT FOR FAST TRANSIENTS TESTING OF DIFFERENT TYPE SILICON SOLAR CELLS (en)
skos:notation	RIV/00216305:26220/08:PU78899!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Boušek, Jaroslav
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	386111
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/08:PU78899
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Silicon solar cells, lifetime, breakdown voltage (en)
http://linked.open.../riv/klicoveSlovo	lifetime breakdown voltage Silicon solar cells
http://linked.open...ontrolniKodProRIV	[531D5ABAE15A]
http://linked.open...v/mistoKonaniAkce	Valencie
http://linked.open...i/riv/mistoVydani	Neuveden
http://linked.open...i/riv/nazevZdroje	23rd EU PVSEC, Valencie, Spain 2008
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...UplatneniVysledku	2008
http://linked.open...iv/tvurceVysledku	Poruba, Aleš Boušek, Jaroslav
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2008-09-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	3-936338-24-8
http://localhost/t...ganizacniJednotka	26220

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