Attributes | Values |
---|
rdf:type
| |
Description
| - Traps appearing both in the AlGaN/GaN and AlGaAs/GaAs heterostructures are assigned by the low frequency noise measurements. Current collapse has been monitored throughout the unpassivated and SiN-passivation processes of the AlGaN/GaN heterostructures: the noise level of E1 (47 meV) trap decreased by 10 dBA/?Hz by the SiN passivation process together with the current collapse in IV curves, while E2 (131 meV) and E3 (235 meV) levels became apparent after SiN passivation. The commercially available AlGaAs/GaAs LED heads for the page and FAX printers are found to have several deep levels introduced during the contact formation processes.
- Traps appearing both in the AlGaN/GaN and AlGaAs/GaAs heterostructures are assigned by the low frequency noise measurements. Current collapse has been monitored throughout the unpassivated and SiN-passivation processes of the AlGaN/GaN heterostructures: the noise level of E1 (47 meV) trap decreased by 10 dBA/?Hz by the SiN passivation process together with the current collapse in IV curves, while E2 (131 meV) and E3 (235 meV) levels became apparent after SiN passivation. The commercially available AlGaAs/GaAs LED heads for the page and FAX printers are found to have several deep levels introduced during the contact formation processes. (en)
|
Title
| - EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS
- EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS (en)
|
skos:prefLabel
| - EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS
- EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS (en)
|
skos:notation
| - RIV/00216305:26220/08:PU78578!RIV11-MSM-26220___
|
http://linked.open...avai/riv/aktivita
| |
http://linked.open...avai/riv/aktivity
| |
http://linked.open...vai/riv/dodaniDat
| |
http://linked.open...aciTvurceVysledku
| |
http://linked.open.../riv/druhVysledku
| |
http://linked.open...iv/duvernostUdaju
| |
http://linked.open...titaPredkladatele
| |
http://linked.open...dnocenehoVysledku
| |
http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/08:PU78578
|
http://linked.open...riv/jazykVysledku
| |
http://linked.open.../riv/klicovaSlova
| - GaN, HEMT, 1/f noise (en)
|
http://linked.open.../riv/klicoveSlovo
| |
http://linked.open...ontrolniKodProRIV
| |
http://linked.open...v/mistoKonaniAkce
| |
http://linked.open...i/riv/mistoVydani
| |
http://linked.open...i/riv/nazevZdroje
| |
http://linked.open...in/vavai/riv/obor
| |
http://linked.open...ichTvurcuVysledku
| |
http://linked.open...cetTvurcuVysledku
| |
http://linked.open...UplatneniVysledku
| |
http://linked.open...iv/tvurceVysledku
| - Tacano, Munecazu
- Šikula, Josef
- Tanuma, Nobuhisa
- Matsui, Toshiaki
- Okumura, Hajime
- Yagi, Shuichi
|
http://linked.open...vavai/riv/typAkce
| |
http://linked.open.../riv/zahajeniAkce
| |
http://linked.open...n/vavai/riv/zamer
| |
number of pages
| |
http://purl.org/ne...btex#hasPublisher
| |
https://schema.org/isbn
| |
http://localhost/t...ganizacniJednotka
| |