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Description
  • This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.
  • This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions. (en)
Title
  • Process Characterization and Description in Order to Reliability Assessment
  • Process Characterization and Description in Order to Reliability Assessment (en)
skos:prefLabel
  • Process Characterization and Description in Order to Reliability Assessment
  • Process Characterization and Description in Order to Reliability Assessment (en)
skos:notation
  • RIV/00216305:26220/08:PU78232!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GP102/07/P493), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika
  • 4
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 390030
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/08:PU78232
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • analysis, variation, quantification, experiment, optimization, factor, response, design (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [283AD9E1AE80]
http://linked.open...i/riv/nazevZdroje
  • International Journal of Circuits Systems and Signal Processing
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 2007
http://linked.open...iv/tvurceVysledku
  • Novotný, Radovan
http://linked.open...n/vavai/riv/zamer
issn
  • 1998-4464
number of pages
http://localhost/t...ganizacniJednotka
  • 26220
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