About: Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices

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About: Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here. Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here. (en) Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here. (cs)
Title	Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices (en) Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices (cs)
skos:prefLabel	Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices (en) Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices (cs)
skos:notation	RIV/00216305:26220/08:PU78221!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GP102/07/P493), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Novotný, Radovan
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	366087
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/08:PU78221
http://linked.open...riv/jazykVysledku	cze - čeština
http://linked.open.../riv/klicovaSlova	design, experiment, factor, multi-vari analysis, optimization, response, variation (en)
http://linked.open.../riv/klicoveSlovo	factor design experiment optimization response variation multi-vari analysis
http://linked.open...odStatuVydavatele	GR - Řecká republika
http://linked.open...ontrolniKodProRIV	[1712168A29AA]
http://linked.open...i/riv/nazevZdroje	WSEAS Applied Informatics & Communications
http://linked.open...in/vavai/riv/obor	JS
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...vavai/riv/projekt	Development in the Area of Technological Procedures Characterization
http://linked.open...UplatneniVysledku	2008
http://linked.open...v/svazekPeriodika	2008
http://linked.open...iv/tvurceVysledku	Novotný, Radovan
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
issn	1790-5117
number of pages	4 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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