About: Advanced non-destructive diagnostics of monocrystalline silicon solar cells

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Measurements of reverse-biased junctions can provide valuable information on the solar cells and their defects. A number of papers were published in the past concerning the measurement methodology, however, for devices having relatively low pn junction area only. The junction area is much larger in solar cells. Therefore, a new measurement methodology had to be developed for them. In large-area pn junctions, there are some phenomena which are negligible in the smaller-area junction measurements, but are introducing considerable errors in the measurement results of large-area junctions. The barrier capacity is one of the parameters of the solar cells under investigation. We employed the near-field and the electron microscopy to study the solar cell surface texture, which provided us with some information on the pn junction configuration. Measurements of reverse-biased junctions can provide valuable information on the solar cells and their defects. A number of papers were published in the past concerning the measurement methodology, however, for devices having relatively low pn junction area only. The junction area is much larger in solar cells. Therefore, a new measurement methodology had to be developed for them. In large-area pn junctions, there are some phenomena which are negligible in the smaller-area junction measurements, but are introducing considerable errors in the measurement results of large-area junctions. The barrier capacity is one of the parameters of the solar cells under investigation. We employed the near-field and the electron microscopy to study the solar cell surface texture, which provided us with some information on the pn junction configuration. (en)
Title	Advanced non-destructive diagnostics of monocrystalline silicon solar cells Advanced non-destructive diagnostics of monocrystalline silicon solar cells (en)
skos:prefLabel	Advanced non-destructive diagnostics of monocrystalline silicon solar cells Advanced non-destructive diagnostics of monocrystalline silicon solar cells (en)
skos:notation	RIV/00216305:26220/08:PU74150!RIV10-MSM-26220___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/06/1551), Z(MSM0021630503)
http://linked.open...iv/cisloPeriodika	9
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Koktavý, Pavel Macků, Robert
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	355000
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/08:PU74150
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	solar cell, pn junction, barrier capacitance, scanning near-field optical microscopy (SNOM) (en)
http://linked.open.../riv/klicoveSlovo	pn junction solar cell barrier capacitance scanning near-field optical microscopy (SNOM)
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[E74E81B4E006]
http://linked.open...i/riv/nazevZdroje	WSEAS Transactions on Electronics
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of PN junction electronic devices by means of microplasma noise evaluation
http://linked.open...UplatneniVysledku	2008
http://linked.open...v/svazekPeriodika	4
http://linked.open...iv/tvurceVysledku	Koktavý, Pavel Macků, Robert Škarvada, Pavel
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
issn	1109-9445
number of pages	6 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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