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  • In this work we described measurement method for determine one of recombination parameters. For determination of lifetime minority carrier we used very know microwave-detected photoconductance decay (MW-PCD). The layers of SiNx were sputtered by means of RF magnetron. The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by Solartec company (Czech republic).
  • In this work we described measurement method for determine one of recombination parameters. For determination of lifetime minority carrier we used very know microwave-detected photoconductance decay (MW-PCD). The layers of SiNx were sputtered by means of RF magnetron. The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by Solartec company (Czech republic). (en)
  • Tato práce se zabývá zjišťováním jednoho ze zásadních rekombinačních parametrů na povrchu křemíkových substrátů. Doba života je měřena metodou MW-PCD (Microwave Photoconductance Decay). Měřené pasivační vrstvy SiNx byly deponovány na křemíkový povrch technologií RF magnetronového naprašování. Cílem práce bylo určení úrovně povrchové rekombinace na přední a zadní straně solárního článku a optických vlastností danných naprašovaných vrstev. Výsledky byly porovnávány se standardními články vyráběnými firmou Solartec s.r.o. (cs)
Title
  • Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement
  • Měření naprašovaných vrstev metodou MW-PCD (cs)
  • Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement (en)
skos:prefLabel
  • Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement
  • Měření naprašovaných vrstev metodou MW-PCD (cs)
  • Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement (en)
skos:notation
  • RIV/00216305:26220/07:PU68520!RIV08-MSM-26220___
http://linked.open.../vavai/riv/strany
  • 313-316
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 453311
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/07:PU68520
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • solar cell, surface passivation, antireflection coating, silicon nitride (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [E4453B1F3DC4]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Neuveden
http://linked.open...i/riv/nazevZdroje
  • Student EEICT 2007, Volume 4
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hégr, Ondřej
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Neuveden
https://schema.org/isbn
  • 978-80-214-3410-3
http://localhost/t...ganizacniJednotka
  • 26220
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