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  • The paper deals with nonlinear on-chip capacitor characterization. A modification of CBCM (Charge-Based Capacitance Measurements) has been proposed. The CBCM method was originally developed for linear interconnect-capacitance measurements. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. The main advantage of the method is high resolution although it is based on equipment found in any average laboratory. A test-chip implementing the method was designed and manufactured in 0.35m CMOS process. Verification against known capacitances proved the method correctness and accuracy. The test-chip was successfully used for MOSFET gate-capacitance characterization.
  • The paper deals with nonlinear on-chip capacitor characterization. A modification of CBCM (Charge-Based Capacitance Measurements) has been proposed. The CBCM method was originally developed for linear interconnect-capacitance measurements. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. The main advantage of the method is high resolution although it is based on equipment found in any average laboratory. A test-chip implementing the method was designed and manufactured in 0.35m CMOS process. Verification against known capacitances proved the method correctness and accuracy. The test-chip was successfully used for MOSFET gate-capacitance characterization. (en)
Title
  • Characterization of Nonlinear On-Chip Capacitors
  • Characterization of Nonlinear On-Chip Capacitors (en)
skos:prefLabel
  • Characterization of Nonlinear On-Chip Capacitors
  • Characterization of Nonlinear On-Chip Capacitors (en)
skos:notation
  • RIV/00216305:26220/07:PU68095!RIV10-GA0-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/05/0277), P(GA102/05/0771), Z(MSM0021630513)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 413345
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/07:PU68095
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  • Microelectronics, CBCM, testing (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [5105DA12D8EA]
http://linked.open...v/mistoKonaniAkce
  • Brno
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  • Brno
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  • Proceedings of the 17th International Conference Radioelektronka 2007
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  • Kolka, Zdeněk
  • Sutorý, Tomáš
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • Vysoké učení technické v Brně
https://schema.org/isbn
  • 1-4244-0821-0
http://localhost/t...ganizacniJednotka
  • 26220
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