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  • For detection of local defects in solar cells LBIC (Light Beam Induced Current) is a widely used universal method. The resulting picture indicates differences in local series and shunt resistances and differences in local rate of minority carriers recombination. A laser beam scanning over the solar cell surface is routinely used in this test. This process may take several hours depending on demanded picture resolution. A method for fast scanning of solar cells based on the LBIC measurement was proposed and tested. Instead of laser beam a linear light source consistent of multiple SMD LED diodes is used. Scanning is performed in both X and Y axes. In principle one scan in each coordinate is sufficient. The resulting current response is influenced by all defects allocated in the actual position of the actuating light beam line. The picture of the solar cell defects is computed combining the contributions from each line in both X and Y axes. Result of this computation is not the same as the LBIC picture
  • For detection of local defects in solar cells LBIC (Light Beam Induced Current) is a widely used universal method. The resulting picture indicates differences in local series and shunt resistances and differences in local rate of minority carriers recombination. A laser beam scanning over the solar cell surface is routinely used in this test. This process may take several hours depending on demanded picture resolution. A method for fast scanning of solar cells based on the LBIC measurement was proposed and tested. Instead of laser beam a linear light source consistent of multiple SMD LED diodes is used. Scanning is performed in both X and Y axes. In principle one scan in each coordinate is sufficient. The resulting current response is influenced by all defects allocated in the actual position of the actuating light beam line. The picture of the solar cell defects is computed combining the contributions from each line in both X and Y axes. Result of this computation is not the same as the LBIC picture (en)
  • Pro detekci lokálních defektů v solárním článku se používá velmi často metody LBIC (Light Beam Induced Current). Výsledkem je obrázek indikující rozdíly v lokální sériové a derivační rezistivitě a také lokální míře rekombinace minoritních nosičů. Laserový paprsek scanuje pod povrchem solárního článku. Celý proces je závislý na požadované kvalitě výstupního obrázku. Test tedy může trvat i několik hodin. Metoda pro rychlé rastrování solárního článku je založena na principu metody LBIC a také využívá částečně její pracoviště. Místo laserového paprsku je instalována řada červených SMD LED přes celou délku solárního článku. Rastrování probíhá v osách X a Y. V principu stačí jedno přerastrování v těchto souřadnicích. Z proudové odezvy paprsku je poznat rozložení defektů v ploše. Hodnoty z nascanovaných souřadnic jsou v počítači ukládány do matice a sečteny. Zobrazení výpočtu není stejné jako u metod (cs)
Title
  • Fast LBIC Scanning of Solar Cells
  • Fast LBIC Scanning of Solar Cells (en)
  • Rychlé rastrování (cs)
skos:prefLabel
  • Fast LBIC Scanning of Solar Cells
  • Fast LBIC Scanning of Solar Cells (en)
  • Rychlé rastrování (cs)
skos:notation
  • RIV/00216305:26220/06:PU65166!RIV07-MSM-26220___
http://linked.open.../vavai/riv/strany
  • 539-542
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  • Z(MSM0021630503)
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  • 475584
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  • RIV/00216305:26220/06:PU65166
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  • solar cells (en)
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  • [3966518C9451]
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  • Brno
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  • Brno
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  • Electronic Devices and Systems EDS 06
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  • Bařinka, Radim
  • Fořt, Tomáš
  • Janda, Marcel
  • Kubíčková, Kristýna
  • Boušek, Jaroslav
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
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  • Ing. Zdeněk Novotný CSc.
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  • 80-214-3246-2
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  • 26220
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