Attributes | Values |
---|
rdf:type
| |
Description
| - V elektrické impedanční tomografii se aplikuje proud na elektrody přiložené na povrch zkoumaného objektu. Na těchto elektrodách se snímá napětí a vyhodnocuje se impedivita daného objektu. Za předem stanovených podmínek je možné vyhodnocovat pouze rozložení konduktivity. Jedná se o inverzní špatně podmíněnou úlohu, a proto musí být použita regularizace. Je vyvíjeno mnoho regularizačních technik, jejichž cílem je získat co nejpřesnější rozložení hledané konduktivity. V článku jsou předloženy nové varianty regularizací aplikované na testování poruch (prasklin) ve vodivých materiálech. (cs)
- In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object, and the resulting voltages are measured using the same or additional electrodes. Internal conductivity distribution is recalculated from the measured voltages and currents. The problem is very ill posed, and therefore, regularization has to be used. The aim is to reconstruct, as accurately as possible, the conductivity distribution in phantom using finite element method (FEM). In this paper are proposed variations of the regularization term, which are applied to non-destructive identification of defects (voids or cracks) in conductive material.
- In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object, and the resulting voltages are measured using the same or additional electrodes. Internal conductivity distribution is recalculated from the measured voltages and currents. The problem is very ill posed, and therefore, regularization has to be used. The aim is to reconstruct, as accurately as possible, the conductivity distribution in phantom using finite element method (FEM). In this paper are proposed variations of the regularization term, which are applied to non-destructive identification of defects (voids or cracks) in conductive material. (en)
|
Title
| - Identification of defects in materials
- Identification of defects in materials (en)
- Identifikace poruch v materiálech (cs)
|
skos:prefLabel
| - Identification of defects in materials
- Identification of defects in materials (en)
- Identifikace poruch v materiálech (cs)
|
skos:notation
| - RIV/00216305:26220/06:PU63340!RIV07-MSM-26220___
|
http://linked.open.../vavai/riv/strany
| |
http://linked.open...avai/riv/aktivita
| |
http://linked.open...avai/riv/aktivity
| - Z(MSM0021630513), Z(MSM0021630516)
|
http://linked.open...vai/riv/dodaniDat
| |
http://linked.open...aciTvurceVysledku
| |
http://linked.open.../riv/druhVysledku
| |
http://linked.open...iv/duvernostUdaju
| |
http://linked.open...titaPredkladatele
| |
http://linked.open...dnocenehoVysledku
| |
http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/06:PU63340
|
http://linked.open...riv/jazykVysledku
| |
http://linked.open.../riv/klicovaSlova
| - Impedance tomography, inverse problem, non-destructive testing (en)
|
http://linked.open.../riv/klicoveSlovo
| |
http://linked.open...ontrolniKodProRIV
| |
http://linked.open...v/mistoKonaniAkce
| - L'Institut Supérieur d'Electronique de Pari
|
http://linked.open...i/riv/mistoVydani
| |
http://linked.open...i/riv/nazevZdroje
| - Proceedings of the Internation Workshop ISEP-DTEE 2006
|
http://linked.open...in/vavai/riv/obor
| |
http://linked.open...ichTvurcuVysledku
| |
http://linked.open...cetTvurcuVysledku
| |
http://linked.open...UplatneniVysledku
| |
http://linked.open...iv/tvurceVysledku
| - Dědková, Jarmila
- Bachorec, Tibor
|
http://linked.open...vavai/riv/typAkce
| |
http://linked.open.../riv/zahajeniAkce
| |
http://linked.open...n/vavai/riv/zamer
| |
number of pages
| |
http://purl.org/ne...btex#hasPublisher
| |
https://schema.org/isbn
| |
http://localhost/t...ganizacniJednotka
| |