About: Fast LBIC scanning of solar cells

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Popis metody rychlého skenování solárních článků, srovnání s metodou LBIC a následně vytvořený simulační program, který má za úkol vytvořit obraz solárního článku podle naměřených hodnot. (cs) For detection of local defects in solar cells LBIC (Light Beam Induced Current) is a widely used universal method. The resulting picture indicates differences in local series and shunt resistances and differences in local rate of minority carriers recombination. A laser beam scanning over the solar cell surface is routinely used in this test. This process may take several hours depending on demanded picture resolution. A method for fast scanning of solar cells based on the LBIC measurement was proposed and tested. Instead of laser beam a linear light source consistent of multiple SMD LED diodes is used. Scanning is performed in both X and Y axes. In principle one scan in each coordinate is sufficient. The resulting current response is influenced by all defects allocated in the actual position of the actuating light beam line. The picture of the solar cell defects is computed combining the contributions from each line in both X and Y axes. Result of this computation is not the same as the LBIC picture For detection of local defects in solar cells LBIC (Light Beam Induced Current) is a widely used universal method. The resulting picture indicates differences in local series and shunt resistances and differences in local rate of minority carriers recombination. A laser beam scanning over the solar cell surface is routinely used in this test. This process may take several hours depending on demanded picture resolution. A method for fast scanning of solar cells based on the LBIC measurement was proposed and tested. Instead of laser beam a linear light source consistent of multiple SMD LED diodes is used. Scanning is performed in both X and Y axes. In principle one scan in each coordinate is sufficient. The resulting current response is influenced by all defects allocated in the actual position of the actuating light beam line. The picture of the solar cell defects is computed combining the contributions from each line in both X and Y axes. Result of this computation is not the same as the LBIC picture (en)
Title	Fast LBIC scanning of solar cells Fast LBIC scanning of solar cells (en) Rychlé rastrování solárních článků (cs)
skos:prefLabel	Fast LBIC scanning of solar cells Fast LBIC scanning of solar cells (en) Rychlé rastrování solárních článků (cs)
skos:notation	RIV/00216305:26220/06:PU63228!RIV07-GA0-26220___
http://linked.open.../vavai/riv/strany	347-349
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/06/1551), Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2007
http://linked.open...aciTvurceVysledku	Janda, Marcel Boušek, Jaroslav Fořt, Tomáš Kubíčková, Kristýna
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	475582
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/06:PU63228
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	solar cells, simulation program (en)
http://linked.open.../riv/klicoveSlovo	solar cells simulation program
http://linked.open...ontrolniKodProRIV	[A65ECE98C409]
http://linked.open...v/mistoKonaniAkce	Dresden
http://linked.open...i/riv/mistoVydani	NEUVEDEN
http://linked.open...i/riv/nazevZdroje	21.european photovoltaic solar energy conference
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of PN junction electronic devices by means of microplasma noise evaluation
http://linked.open...UplatneniVysledku	2006
http://linked.open...iv/tvurceVysledku	Fořt, Tomáš Janda, Marcel Kubíčková, Kristýna Boušek, Jaroslav
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2006-09-04 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	3 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	3-936338-20-5
http://localhost/t...ganizacniJednotka	26220

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