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| rdf:type
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| Description
| - Materials with different electrical conductivity and/or magnetic susceptibility can cause deformation of magnetic field in MR tomograph, resulting in errors in obtained image. Using simulation and experimental verification we can solve the effect of changes in homogeneity of static and HF magnetic fields caused by specimen made from conductive and/or magnetic material in MR tomograph. This paper describes theoretical base and experimental measurement of the magnetic resonance imaging method for susceptibility measurement. Described technique is suitable for substances with no signal in MR tomography. The method uses deformation of magnetic induction field in specimen vicinity. For MR purposes it is necessary to immerse specimen into reference medium with measurable MR signal (demineralized water is suitable). Shape of magnetic field changed by specimen impact (reaction field) we measure by means of Gradient Echo (GE) measuring method.
- Materials with different electrical conductivity and/or magnetic susceptibility can cause deformation of magnetic field in MR tomograph, resulting in errors in obtained image. Using simulation and experimental verification we can solve the effect of changes in homogeneity of static and HF magnetic fields caused by specimen made from conductive and/or magnetic material in MR tomograph. This paper describes theoretical base and experimental measurement of the magnetic resonance imaging method for susceptibility measurement. Described technique is suitable for substances with no signal in MR tomography. The method uses deformation of magnetic induction field in specimen vicinity. For MR purposes it is necessary to immerse specimen into reference medium with measurable MR signal (demineralized water is suitable). Shape of magnetic field changed by specimen impact (reaction field) we measure by means of Gradient Echo (GE) measuring method. (en)
- Materiály s rozdílnou elektrickou vodivostí nebo magnetickou susceptibilitou způsobují deformace magnetického pole v MR tomografu, což vede k chybám v obraze. Pomocí simulace a experimentálního ověření můžeme ověřit efekt změny homogenity statického a vf magnetického pole způsobeného vlive vlastností materiálů vzorku. Článek popisuje teoretické základy a experimentální výsledky zobrazovací MR metody pro měření susceptibility. Popsaná technika je vhodná i pro materiály nevykazující MR aktivitu, využívá měření změn pole v okolí vzorku. Z důvodu MR zonrazování je nezbytné vzorek obklopit referenčním médiem - např. vodou. ZMěna pole v okolí vzorku (tzv. reakční pole) je měřena pomocí metody gradientního echa (GE). (cs)
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| Title
| - Measurement and simulation of material influence in MR tomography
- Measurement and simulation of material influence in MR tomography (en)
- Měření a simulace vliv materiálu v MR tomografii (cs)
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| skos:prefLabel
| - Measurement and simulation of material influence in MR tomography
- Measurement and simulation of material influence in MR tomography (en)
- Měření a simulace vliv materiálu v MR tomografii (cs)
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| skos:notation
| - RIV/00216305:26220/06:PU61666!RIV07-MSM-26220___
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| http://linked.open.../vavai/riv/strany
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| http://linked.open...avai/riv/aktivita
| |
| http://linked.open...avai/riv/aktivity
| - P(KJB208130603), P(KJB208130604), Z(MSM0021630513)
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| http://linked.open...vai/riv/dodaniDat
| |
| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
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| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
| |
| http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/06:PU61666
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - MR tomography, magnetic susceptibility, conductivity, reaction field, gradient echo (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...ontrolniKodProRIV
| |
| http://linked.open...v/mistoKonaniAkce
| - L'Institut Supérieur d'Electronique de Pari
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| http://linked.open...i/riv/mistoVydani
| - L'Institut Supérieur d'Electronique de Pari
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| http://linked.open...i/riv/nazevZdroje
| - Proceedings of the International Workshop ISEP - UTEE 3. - 6. 9. 2006 Paris
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| http://linked.open...in/vavai/riv/obor
| |
| http://linked.open...ichTvurcuVysledku
| |
| http://linked.open...cetTvurcuVysledku
| |
| http://linked.open...vavai/riv/projekt
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| http://linked.open...UplatneniVysledku
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| http://linked.open...iv/tvurceVysledku
| - Bartušek, Karel
- Steinbauer, Miloslav
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| http://linked.open...vavai/riv/typAkce
| |
| http://linked.open.../riv/zahajeniAkce
| |
| http://linked.open...n/vavai/riv/zamer
| |
| number of pages
| |
| http://purl.org/ne...btex#hasPublisher
| - L'Institut Supérieur d'Electronique de Paris, Paris, France
|
| https://schema.org/isbn
| |
| http://localhost/t...ganizacniJednotka
| |
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