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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 - 500 mV was used. The voltage bias was madde with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed. Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 - 500 mV was used. The voltage bias was madde with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed. (en) Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 - 500 mV was used. The voltage bias was madde with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed. (cs)
Title	Dynamické testování solárních článků. Dynamic testing of solar cells (en) Dynamické testování solárních článků. (cs)
skos:prefLabel	Dynamické testování solárních článků. Dynamic testing of solar cells (en) Dynamické testování solárních článků. (cs)
skos:notation	RIV/00216305:26220/05:PU54519!RIV06-MSM-26220___
http://linked.open.../vavai/riv/strany	168-173
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021630503)
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Boušek, Jaroslav
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	518960
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/05:PU54519
http://linked.open...riv/jazykVysledku	cze - čeština
http://linked.open.../riv/klicovaSlova	solar cells, reverse breakdown voltage, minority carrier lifetime, recombination, diffusion capacitance (en)
http://linked.open.../riv/klicoveSlovo	solar cells recombination diffusion capacitance reverse breakdown voltage minority carrier lifetime
http://linked.open...ontrolniKodProRIV	[614068C04FB9]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Mikrosyn. Nové trendy v mikroelektronických systémech a nanotechnologiích. Sborník seminare
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...UplatneniVysledku	2005
http://linked.open...iv/tvurceVysledku	Boušek, Jaroslav
http://linked.open...vavai/riv/typAkce	CST - Celostátní
http://linked.open.../riv/zahajeniAkce	2005-12-12 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Nové trendy v mikroelektronických systémech a nanotechnologiích (MIKROSYN)
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Ing. Zdeněk Novotný CSc.
https://schema.org/isbn	80-214-3116-4
http://localhost/t...ganizacniJednotka	26220

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